Abstract

Non-axisymmetric cavities are widely used as standard blackbody sources for radiation thermometry. The integrated effective emissivity is central to the blackbody design. Integrated effective emissivities are numerically calculated for non-isothermal, non-axisymmetric cavities. The average relative deviation is 0.087% when compared with Monte-Carlo results, indicating that this method can accurately calculate the integrated effective emissivities for non-isothermal, non-axisymmetric cavities. The effects of the wavelength, temperature uniformity, and bottom inclination angle are then analyzed.

© 2013 Chinese Optics Letters

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2012 (1)

Y. Duan, D. Liu, J. Wang, and Z. Yang, J. Therm. Sci. Technol. 11, 125 (2012).

2010 (1)

A. V. Prokhorov and L. M. Hanssen, Metrologia 47, 33 (2010).

2006 (1)

2004 (2)

H. McEvoy, R. Simpson, and G. Machin, Proc. SPIE 5405, 54 (2004).

A. V. Prokhorov and L. M. Hanssen, Metrologia 41, 421 (2004).

2003 (1)

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

2002 (1)

A. S. Nester and J. R. Mahan, Proc. SPIE 4710, 9 (2002).

2001 (2)

U. Mester and P. Winter, Proc. SPIE 4360, 372 (2001).

J. Ishii and A. Ono, Meas. Sci. Technol. 12, 2103 (2001).

1998 (1)

J. Ishii, M. Kobayashi, and F. Sakuma, Metrologia 35, 175 (1998).

1996 (1)

M. J. Ballico, Metrologia 32, 259 (1996).

1995 (1)

1992 (1)

V. I. Sapritsk and A. V. Prokhorov, Metrologia 29, 9 (1992).

1980 (1)

1973 (1)

Ballico, M. J.

M. J. Ballico, Metrologia 32, 259 (1996).

Briaudeau, S.

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

Camy-Peyret, C.

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

Dai, J.

Duan, Y.

Y. Duan, D. Liu, J. Wang, and Z. Yang, J. Therm. Sci. Technol. 11, 125 (2012).

Fanjeaux, M.

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

Hanssen, L. M.

A. V. Prokhorov and L. M. Hanssen, Metrologia 47, 33 (2010).

A. V. Prokhorov and L. M. Hanssen, Metrologia 41, 421 (2004).

Heinisch, R. P.

Ishii, J.

J. Ishii and A. Ono, Meas. Sci. Technol. 12, 2103 (2001).

J. Ishii, M. Kobayashi, and F. Sakuma, Metrologia 35, 175 (1998).

Jeseck, P.

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

Kobayashi, M.

J. Ishii, M. Kobayashi, and F. Sakuma, Metrologia 35, 175 (1998).

Liu, D.

Y. Duan, D. Liu, J. Wang, and Z. Yang, J. Therm. Sci. Technol. 11, 125 (2012).

Machin, G.

H. McEvoy, R. Simpson, and G. Machin, Proc. SPIE 5405, 54 (2004).

Mahan, J. R.

A. S. Nester and J. R. Mahan, Proc. SPIE 4710, 9 (2002).

McEvoy, H.

H. McEvoy, R. Simpson, and G. Machin, Proc. SPIE 5405, 54 (2004).

Mester, U.

U. Mester and P. Winter, Proc. SPIE 4360, 372 (2001).

Nester, A. S.

A. S. Nester and J. R. Mahan, Proc. SPIE 4710, 9 (2002).

Ono, A.

J. Ishii and A. Ono, Meas. Sci. Technol. 12, 2103 (2001).

A. Ono, J. Opt. Soc. Am. 70, 547 (1980).

Payan, S.

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

Prokhorov, A. V.

A. V. Prokhorov and L. M. Hanssen, Metrologia 47, 33 (2010).

A. V. Prokhorov and L. M. Hanssen, Metrologia 41, 421 (2004).

V. I. Sapritsky and A. V. Prokhorov, Appl. Opt. 34, 5645 (1995).

V. I. Sapritsk and A. V. Prokhorov, Metrologia 29, 9 (1992).

Sakuma, F.

J. Ishii, M. Kobayashi, and F. Sakuma, Metrologia 35, 175 (1998).

Sapritsk, V. I.

V. I. Sapritsk and A. V. Prokhorov, Metrologia 29, 9 (1992).

Sapritsky, V. I.

Shamsund, N.

Simpson, R.

H. McEvoy, R. Simpson, and G. Machin, Proc. SPIE 5405, 54 (2004).

Sparrow, E. M.

Te, Y.

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

Wang, J.

Y. Duan, D. Liu, J. Wang, and Z. Yang, J. Therm. Sci. Technol. 11, 125 (2012).

Winter, P.

U. Mester and P. Winter, Proc. SPIE 4360, 372 (2001).

Yang, Z.

Y. Duan, D. Liu, J. Wang, and Z. Yang, J. Therm. Sci. Technol. 11, 125 (2012).

Zhang, H.

Appl. Opt. (1)

Chin. Opt. Lett. (1)

J. Opt. Soc. Am. (2)

J. Therm. Sci. Technol. (1)

Y. Duan, D. Liu, J. Wang, and Z. Yang, J. Therm. Sci. Technol. 11, 125 (2012).

Meas. Sci. Technol. (1)

J. Ishii and A. Ono, Meas. Sci. Technol. 12, 2103 (2001).

Metrologia (6)

J. Ishii, M. Kobayashi, and F. Sakuma, Metrologia 35, 175 (1998).

Y. Te, P. Jeseck, C. Camy-Peyret, S. Payan, S. Briaudeau, and M. Fanjeaux, Metrologia 40, 24 (2003).

V. I. Sapritsk and A. V. Prokhorov, Metrologia 29, 9 (1992).

M. J. Ballico, Metrologia 32, 259 (1996).

A. V. Prokhorov and L. M. Hanssen, Metrologia 41, 421 (2004).

A. V. Prokhorov and L. M. Hanssen, Metrologia 47, 33 (2010).

Proc. SPIE (3)

H. McEvoy, R. Simpson, and G. Machin, Proc. SPIE 5405, 54 (2004).

A. S. Nester and J. R. Mahan, Proc. SPIE 4710, 9 (2002).

U. Mester and P. Winter, Proc. SPIE 4360, 372 (2001).

Other (5)

J. Ishii, T. Fukuzaki, T. Kojima, and A. Ono, in Proceedings of 8th International Symposium on Temperature and Thermal Measurements in Industry and Science 729 (2001).

H. C. McEvoy, G. Machin, R. Friedrich, J. Hartmann, and J. Hollandt, AIP Conf. Proc. Temperature: Its Measurement and Control in Science and Industry 909 (2003).

J. Hartmann, D. R. Taubert, and J. Fischer, in Proceedings of 7th International Symposium on Temperature and Thermal Measurements in Industry and Science 511 (1999).

A. Diril, H. Nasibov, and S. Ugur, AIP Conf. Proc. Temperature: Its Measurement and Control in Science and Industry 663 (2003).

Z. Chu, J. Dai, and R. E. Bedford, AIP Conf. Proc. Temperature: Its Measurement and Control in Science and Industry 907 (1992).

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