Abstract

As a new research area, laser surface wettability modification brings new applications for both laser and materials for industry. The picoseconds (10 ps) pulse laser surface micro-processing over alumina covered aluminium is researched. In the experiment, 10-ps laser pulse is employed and the energy threshold for different laser wavelength and repetition rate is measured. At the repetition rate of 5 kHz, the energy thresholds are: 1 064 nm: 4.0 μJ/pulse, 532 nm: 2.8 μJ/pulse, and 355 nm: 4.2 μJ/pulse. Picoseconds pulse laser is demonstrated feasible in surface scanning at industrial level.

© 2013 Chinese Optics Letters

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  1. D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).
  2. P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).
  3. S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).
  4. Y. Yonemoto and T. Kunugi, J. Chem. Phys. 130, 144106 (2009).
  5. M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).
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  7. M. E. Schrader and G. I. Loeb, Modern Approaches to Wettability. Theory and Applications (Plenum Press, New York, 1992).
  8. P. G. de Gennes, Rev. Mod. Phys. 57, 827 (1985).

2012

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

2009

D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).

Y. Yonemoto and T. Kunugi, J. Chem. Phys. 130, 144106 (2009).

2008

C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

2005

S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

2000

P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

1985

P. G. de Gennes, Rev. Mod. Phys. 57, 827 (1985).

Berg, J. M.

S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

Bhattacharya, S.

S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

Bouali, M. Ould

P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

Choi, W. K.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Datta, A.

S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

Dawood, M. K.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Diehl, D.

D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).

Ellerbrock, R. H.

D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).

Foo, Y. L.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Gangopadhyay, S.

S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

Gennes, P. G. de

P. G. de Gennes, Rev. Mod. Phys. 57, 827 (1985).

Gu, Z.

C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

Han, Y.

C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

Khan, S. A.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Kunugi, T.

Y. Yonemoto and T. Kunugi, J. Chem. Phys. 130, 144106 (2009).

Kurniawan, N. A.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Laurens, P.

P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

Leong, K. C.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Meducin, F.

P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

Rajagopalan, R.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Sadras, B.

P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

Schaumann, G. E.

D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).

Sun, C.

C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

Yonemoto, Y.

Y. Yonemoto and T. Kunugi, J. Chem. Phys. 130, 144106 (2009).

Zhao, X.

C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

Zheng, H.

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Appl. Surface Sci.

P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

Eur. J. Sol. Sci.

D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).

J. Chem. Phys.

Y. Yonemoto and T. Kunugi, J. Chem. Phys. 130, 144106 (2009).

Journal of Microelecrtomech. Syst.

S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

Rev. Mod. Phys.

P. G. de Gennes, Rev. Mod. Phys. 57, 827 (1985).

Soft Matter

M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 (2012).

Thin Solid Films

C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

Other

M. E. Schrader and G. I. Loeb, Modern Approaches to Wettability. Theory and Applications (Plenum Press, New York, 1992).

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