Abstract

An alternative technique for infrasound detection based on the self-mixing (SM) interference of a laser diode is described. The principle involved is the dependence of the power emitted by the laser diode on infrasound-induced membrane vibration. The Fourier transform and fringe-counting methods are used to analyze the self-mixing signal. Infrasound signals are experimentally measured from 2 to 20 Hz with a resolution of 0.25, and the results well agree with the theoretical ones.

© 2013 Chinese Optics Letters

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  2. B. Alcoverro and A. Le Pichon, J. Acoust. Soc. Am. 117, 1717 (2005).
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  4. D. M. Donskoy and B. A. Cray, J. Acoust. Soc. Am. 129, EL254 (2011).
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  10. S. Donati, Laser Photon. Rev. 6, 393 (2012).
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2012 (2)

S. Donati, Laser Photon. Rev. 6, 393 (2012).

D. Silvano, W. Zhao, and Y. Yu, Chin. Opt. (in Chinese) 5, 93 (2012).

2011 (3)

2009 (2)

U. Zabit, T. Bosch, and F. Bony, IEEE Sens. J. 9, 1879 (2009).

X. Dai, M. Wang, Y. Zhao, and J. Zhou, Opt. Express 17, 16543 (2009).

2008 (1)

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

2006 (1)

C. Bes, G. Plantier, and T. Bosch, IEEE T. Instrum. Meas. 55, 1101 (2006).

2005 (1)

B. Alcoverro and A. Le Pichon, J. Acoust. Soc. Am. 117, 1717 (2005).

2003 (2)

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

G. Giuliani, S. Bozzi-Pietra, and S. Donati, Meas. Sci. Technol. 14, 24 (2003).

2002 (1)

G. Giuliani, M. Norgia, S. Donati, and T. Bosch, J. Opt. A-pure Appl. Opt. 4, S283 (2002).

2001 (2)

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

T. Bosch, N. Servagent, and S. Donati, Opt. Eng. 40, 20 (2001).

2000 (1)

A. J. Bedard, Jr, and T. M. Georges, Phys. Today 53, 32 (2000).

1996 (1)

S. Donati, L. Falzoni, and S. Merlo, IEEE T. Instrum. Meas. 45, 942 (1996).

1995 (1)

K. Petermann, IEEE J. Sel. Top. Quantum 1, 480 (1995).

1988 (1)

1980 (1)

R. Lang and K. Kobayashi, IEEE J. Quantum Electron. 16, 347 (1980).

Alcoverro, B.

B. Alcoverro and A. Le Pichon, J. Acoust. Soc. Am. 117, 1717 (2005).

Bedard, A. J.

A. J. Bedard, Jr, and T. M. Georges, Phys. Today 53, 32 (2000).

Bell, M.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Berger, J.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Bernal, O. D.

Bes, C.

C. Bes, G. Plantier, and T. Bosch, IEEE T. Instrum. Meas. 55, 1101 (2006).

Bony, F.

U. Zabit, O. D. Bernal, T. Bosch, and F. Bony, Opt. Lett. 36, 612 (2011).

U. Zabit, T. Bosch, and F. Bony, IEEE Sens. J. 9, 1879 (2009).

Bosch, T.

U. Zabit, O. D. Bernal, T. Bosch, and F. Bony, Opt. Lett. 36, 612 (2011).

U. Zabit, T. Bosch, and F. Bony, IEEE Sens. J. 9, 1879 (2009).

C. Bes, G. Plantier, and T. Bosch, IEEE T. Instrum. Meas. 55, 1101 (2006).

G. Giuliani, M. Norgia, S. Donati, and T. Bosch, J. Opt. A-pure Appl. Opt. 4, S283 (2002).

T. Bosch, N. Servagent, and S. Donati, Opt. Eng. 40, 20 (2001).

Bozzi-Pietra, S.

G. Giuliani, S. Bozzi-Pietra, and S. Donati, Meas. Sci. Technol. 14, 24 (2003).

Campus, P.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Carvalho, J.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Chicharo, J. F.

Christie, D.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Cray, B. A.

D. M. Donskoy and B. A. Cray, J. Acoust. Soc. Am. 129, EL254 (2011).

Dabbicco, M.

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

Dai, X.

Demirovic, E.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Donati, S.

S. Donati, Laser Photon. Rev. 6, 393 (2012).

G. Giuliani, S. Bozzi-Pietra, and S. Donati, Meas. Sci. Technol. 14, 24 (2003).

G. Giuliani, M. Norgia, S. Donati, and T. Bosch, J. Opt. A-pure Appl. Opt. 4, S283 (2002).

T. Bosch, N. Servagent, and S. Donati, Opt. Eng. 40, 20 (2001).

S. Donati, L. Falzoni, and S. Merlo, IEEE T. Instrum. Meas. 45, 942 (1996).

Donskoy, D. M.

D. M. Donskoy and B. A. Cray, J. Acoust. Soc. Am. 129, EL254 (2011).

Falzoni, L.

S. Donati, L. Falzoni, and S. Merlo, IEEE T. Instrum. Meas. 45, 942 (1996).

Fan, Y.

Gallatin, G. M.

Georges, T. M.

A. J. Bedard, Jr, and T. M. Georges, Phys. Today 53, 32 (2000).

Giuliani, G.

G. Giuliani, S. Bozzi-Pietra, and S. Donati, Meas. Sci. Technol. 14, 24 (2003).

G. Giuliani, M. Norgia, S. Donati, and T. Bosch, J. Opt. A-pure Appl. Opt. 4, S283 (2002).

Groot, P. J. De

Hedlin, M. A. H.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Hilt, R.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Hoffmann, T.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Husmann, E.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Kobayashi, K.

R. Lang and K. Kobayashi, IEEE J. Quantum Electron. 16, 347 (1980).

Lang, R.

R. Lang and K. Kobayashi, IEEE J. Quantum Electron. 16, 347 (1980).

Langlois, A.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Lucia, F. De

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

Macomber, S. H.

Martysevich, P.

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Merlo, S.

S. Donati, L. Falzoni, and S. Merlo, IEEE T. Instrum. Meas. 45, 942 (1996).

Mezzapesa, F. P.

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

Nooner, S.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Norgia, M.

G. Giuliani, M. Norgia, S. Donati, and T. Bosch, J. Opt. A-pure Appl. Opt. 4, S283 (2002).

Ottonelli, S.

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

Petermann, K.

K. Petermann, IEEE J. Sel. Top. Quantum 1, 480 (1995).

Pichon, A. Le

B. Alcoverro and A. Le Pichon, J. Acoust. Soc. Am. 117, 1717 (2005).

Plantier, G.

C. Bes, G. Plantier, and T. Bosch, IEEE T. Instrum. Meas. 55, 1101 (2006).

Scamarcio, G.

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

Servagent, N.

T. Bosch, N. Servagent, and S. Donati, Opt. Eng. 40, 20 (2001).

Silvano, D.

D. Silvano, W. Zhao, and Y. Yu, Chin. Opt. (in Chinese) 5, 93 (2012).

Veloso, J. Vivas

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Vietro, M. Di

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

Wang, M.

Widmer-Schnidrig, R.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Xi, J.

Yu, Y.

D. Silvano, W. Zhao, and Y. Yu, Chin. Opt. (in Chinese) 5, 93 (2012).

Y. Fan, Y. Yu, J. Xi, and J. F. Chicharo, Appl. Opt. 50, 5064 (2011).

Zabit, U.

U. Zabit, O. D. Bernal, T. Bosch, and F. Bony, Opt. Lett. 36, 612 (2011).

U. Zabit, T. Bosch, and F. Bony, IEEE Sens. J. 9, 1879 (2009).

Zhao, W.

D. Silvano, W. Zhao, and Y. Yu, Chin. Opt. (in Chinese) 5, 93 (2012).

Zhao, Y.

Zhou, J.

Zumberge, M. A.

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

Appl. Opt. (2)

Chin. Opt. (in Chinese) (1)

D. Silvano, W. Zhao, and Y. Yu, Chin. Opt. (in Chinese) 5, 93 (2012).

IEEE J. Quantum Electron. (1)

R. Lang and K. Kobayashi, IEEE J. Quantum Electron. 16, 347 (1980).

IEEE J. Sel. Top. Quantum (1)

K. Petermann, IEEE J. Sel. Top. Quantum 1, 480 (1995).

IEEE Photon. Technol. Lett. (1)

S. Ottonelli, F. De Lucia, M. Di Vietro, M. Dabbicco, G. Scamarcio, and F. P. Mezzapesa, IEEE Photon. Technol. Lett. 20, 1360 (2008).

IEEE Sens. J. (1)

U. Zabit, T. Bosch, and F. Bony, IEEE Sens. J. 9, 1879 (2009).

IEEE T. Instrum. Meas. (2)

S. Donati, L. Falzoni, and S. Merlo, IEEE T. Instrum. Meas. 45, 942 (1996).

C. Bes, G. Plantier, and T. Bosch, IEEE T. Instrum. Meas. 55, 1101 (2006).

J. Acoust. Soc. Am. (3)

M. A. Zumberge, J. Berger, M. A. H. Hedlin, E. Husmann, S. Nooner, R. Hilt, and R. Widmer-Schnidrig, J. Acoust. Soc. Am. 113, 2474 (2003).

B. Alcoverro and A. Le Pichon, J. Acoust. Soc. Am. 117, 1717 (2005).

D. M. Donskoy and B. A. Cray, J. Acoust. Soc. Am. 129, EL254 (2011).

J. Opt. A-pure Appl. Opt. (1)

G. Giuliani, M. Norgia, S. Donati, and T. Bosch, J. Opt. A-pure Appl. Opt. 4, S283 (2002).

Kerntechnik (1)

D. Christie, J. Vivas Veloso, P. Campus, M. Bell, T. Hoffmann, A. Langlois, P. Martysevich, E. Demirovic, and J. Carvalho, Kerntechnik 66, 96 (2001).

Laser Photon. Rev. (1)

S. Donati, Laser Photon. Rev. 6, 393 (2012).

Meas. Sci. Technol. (1)

G. Giuliani, S. Bozzi-Pietra, and S. Donati, Meas. Sci. Technol. 14, 24 (2003).

Opt. Eng. (1)

T. Bosch, N. Servagent, and S. Donati, Opt. Eng. 40, 20 (2001).

Opt. Express (1)

Opt. Lett. (1)

Phys. Today (1)

A. J. Bedard, Jr, and T. M. Georges, Phys. Today 53, 32 (2000).

Other (5)

S. Donati, Electro-Optical Instrumentation: Sensing and Measuring with Lasers (Prentice Hall, Upper Saddle River, NJ, 2004).

X. Zhang, J. Xi, Y. Yu, and J. Chichero, in Proceedings of the 4th IEEE International Symposium on Electronic Design, Test and Applications 491 (2008).

L. E. Kinsler, A. R. Frey, and A. B. C. J. V. Sanders, Fundamentals of Acoustics (4th Edn.) (Wiley, New York, 1999).

J. S. Wilson, Sensor Technology Handbook (Elsevier, 2005).

B. Jiang, K. Yang, and J. Wang, in Proceedings of the 2010 International Conference on Measuring Technology and Mechatronics Automation (IEEE Computer Society, Changsha, China, 2010) p. 1049.

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