Abstract

Specular and strong reflections are the main problems encountered during part image defect inspection of shiny or highly reflective surfaces. In this letter, we propose an improved illumination method for defect inspection. A diffuse light source is designed based on the physics analysis of light reflection. The distribution of intensity is simulated according to a known model to verify the illumination uniformity of the source. Experiments show that defect expressivity when using the proposed illumination method has a better performance. The optical model is not only suitable for the defect detection of metal balls but also for the defect detection of planes and cylinders.

© 2013 Chinese Optics Letters

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  1. A. C. Sanderson, L. E.Weiss, and S. K. Nayar, IEEE Trans. Pattern Anal. Mach. Intell. 10, 44 (1988).
  2. C. Bakolias and A. K. Forrest, Proc. SPIE 3029, 57 (1997).
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  4. R. Seulin, N. Bonnot, F. Merienne, and P. Gorria, in Proceedings of Conference on Machine Vision and 3-Dimensional Imaging Systems for Inspection and Metrology 129 (2001).
  5. A. Poularikas, Digital Colour Imaging Handbook (CRC Press, Boca Raton, 2003).
  6. T. W. Ng, Meas. Sci. Technol. 18, N73 (2007).
  7. F. P. Leon, in Proceedings of the European Symposium on Lasers and Optics in Manufacturing 297 (1997).
  8. Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).
  9. M. D. Valle, P. Gallina, and A. Gasparetto, IEEE/ASME Transactions on Mechatronics 8, 309 (2003).
  10. B. Liu, W. Liu, and J. Peng, Chin. Opt. Lett. 8, 384 (2010).
  11. Q. Miao, C. Shi, P. Xu, M. Yang, and Y. Shi, Chin. Opt. Lett. 9, 041001 (2011).
  12. K. Khalili and P. Webb, Machine Vision and Applications 18, 73 (2007).
  13. X. Qu, Y. He, F. Han, X. H. Zhao, and S. H. Ye, Acta Opt. Sin. 23, 547 (2003) (in Chinese).
  14. R. Dror, "Surface reflectance recognition and real-world illumination statistics", PhD. Thesis (Massachusetts Institute of Technology, 2002).
  15. G. J. Ward, Comput. Graphics 26, 265 (1992).
  16. Y. Do, S. Lee, and Y. Kim, Meas. Sci. Technol. 22, 107001 (2011).

2011 (2)

Q. Miao, C. Shi, P. Xu, M. Yang, and Y. Shi, Chin. Opt. Lett. 9, 041001 (2011).

Y. Do, S. Lee, and Y. Kim, Meas. Sci. Technol. 22, 107001 (2011).

2010 (2)

B. Liu, W. Liu, and J. Peng, Chin. Opt. Lett. 8, 384 (2010).

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

2007 (2)

T. W. Ng, Meas. Sci. Technol. 18, N73 (2007).

K. Khalili and P. Webb, Machine Vision and Applications 18, 73 (2007).

2003 (1)

M. D. Valle, P. Gallina, and A. Gasparetto, IEEE/ASME Transactions on Mechatronics 8, 309 (2003).

1997 (1)

C. Bakolias and A. K. Forrest, Proc. SPIE 3029, 57 (1997).

1992 (1)

G. J. Ward, Comput. Graphics 26, 265 (1992).

1988 (1)

A. C. Sanderson, L. E.Weiss, and S. K. Nayar, IEEE Trans. Pattern Anal. Mach. Intell. 10, 44 (1988).

Bakolias, C.

C. Bakolias and A. K. Forrest, Proc. SPIE 3029, 57 (1997).

Do, Y.

Y. Do, S. Lee, and Y. Kim, Meas. Sci. Technol. 22, 107001 (2011).

E.Weiss, L.

A. C. Sanderson, L. E.Weiss, and S. K. Nayar, IEEE Trans. Pattern Anal. Mach. Intell. 10, 44 (1988).

Forrest, A. K.

C. Bakolias and A. K. Forrest, Proc. SPIE 3029, 57 (1997).

Gallina, P.

M. D. Valle, P. Gallina, and A. Gasparetto, IEEE/ASME Transactions on Mechatronics 8, 309 (2003).

Gasparetto, A.

M. D. Valle, P. Gallina, and A. Gasparetto, IEEE/ASME Transactions on Mechatronics 8, 309 (2003).

Jia, D.

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

Khalili, K.

K. Khalili and P. Webb, Machine Vision and Applications 18, 73 (2007).

Kim, Y.

Y. Do, S. Lee, and Y. Kim, Meas. Sci. Technol. 22, 107001 (2011).

Lee, S.

Y. Do, S. Lee, and Y. Kim, Meas. Sci. Technol. 22, 107001 (2011).

Lin, Y.

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

Liu, B.

Liu, W.

Liu, X.

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

Miao, Q.

Nayar, S. K.

A. C. Sanderson, L. E.Weiss, and S. K. Nayar, IEEE Trans. Pattern Anal. Mach. Intell. 10, 44 (1988).

Ng, T. W.

T. W. Ng, Meas. Sci. Technol. 18, N73 (2007).

Peng, J.

Sanderson, A. C.

A. C. Sanderson, L. E.Weiss, and S. K. Nayar, IEEE Trans. Pattern Anal. Mach. Intell. 10, 44 (1988).

Shi, C.

Shi, Y.

Valle, M. D.

M. D. Valle, P. Gallina, and A. Gasparetto, IEEE/ASME Transactions on Mechatronics 8, 309 (2003).

Wang, Y.

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

Ward, G. J.

G. J. Ward, Comput. Graphics 26, 265 (1992).

Webb, P.

K. Khalili and P. Webb, Machine Vision and Applications 18, 73 (2007).

Xu, P.

Yang, M.

Zhang, Z.

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

Bearing (1)

Y. Wang, Y. Lin, D. Jia, Z. Zhang, and X. Liu, Bearing 5, 37 (2010).

Chin. Opt. Lett. (2)

Comput. Graphics (1)

G. J. Ward, Comput. Graphics 26, 265 (1992).

IEEE Trans. Pattern Anal. Mach. Intell. (1)

A. C. Sanderson, L. E.Weiss, and S. K. Nayar, IEEE Trans. Pattern Anal. Mach. Intell. 10, 44 (1988).

IEEE/ASME Transactions on Mechatronics (1)

M. D. Valle, P. Gallina, and A. Gasparetto, IEEE/ASME Transactions on Mechatronics 8, 309 (2003).

Machine Vision and Applications (1)

K. Khalili and P. Webb, Machine Vision and Applications 18, 73 (2007).

Meas. Sci. Technol. (2)

Y. Do, S. Lee, and Y. Kim, Meas. Sci. Technol. 22, 107001 (2011).

T. W. Ng, Meas. Sci. Technol. 18, N73 (2007).

Proc. SPIE (1)

C. Bakolias and A. K. Forrest, Proc. SPIE 3029, 57 (1997).

Other (6)

B. G. Batchelor and P. F. Whelan, Intelligent Vision Systems for Industry (Springer-Verlag, London, 1997).

R. Seulin, N. Bonnot, F. Merienne, and P. Gorria, in Proceedings of Conference on Machine Vision and 3-Dimensional Imaging Systems for Inspection and Metrology 129 (2001).

A. Poularikas, Digital Colour Imaging Handbook (CRC Press, Boca Raton, 2003).

F. P. Leon, in Proceedings of the European Symposium on Lasers and Optics in Manufacturing 297 (1997).

X. Qu, Y. He, F. Han, X. H. Zhao, and S. H. Ye, Acta Opt. Sin. 23, 547 (2003) (in Chinese).

R. Dror, "Surface reflectance recognition and real-world illumination statistics", PhD. Thesis (Massachusetts Institute of Technology, 2002).

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