Abstract

A fiber inline interferometric refractive index (RI) sensor consisting of a microchannel and a fiber taper is proposed in this letter. The microchannel is fabricated by combining femtosecond laser micromachining and arc fusion splicing. No subsequent chemical etching process is needed. Three sensors with microchannel widths of 4, 8, and 10 \mu m are prepared. The sensitivity in the RI range from 1.33 to 1.35 is up to ~361.29 nm/RIU at the microchannel width of 8 ?m. The sensitivity is ~20 times greater than that of the paired taper-based MZI sensors and long period fiber grating pair MZI sensors.

© 2013 Chinese Optics Letters

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K. Zhou, Z. Yan, L. Zhang, and I. Bennion, Opt. Express 19, 11769 (2011).

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Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

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Chai, Y. H.

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Duan, D. W.

Fan, X.

I. M. White and X. Fan, Opt. Express 16, 1020 (2008).

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Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

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H. Fu, K. Zhou, P. Saffari, C. Mou, L. Zhang, S. He, and I. Bennion, IEEE Photon. Technol. Lett. 20, 1609 (2008).

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A. Iadicicco, A. Cusano, A. Cutolo, R. Bernini, and M. Giordano, IEEE Photon. Technol. Lett. 16, 1149 (2004).

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Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

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He, S.

H. Fu, K. Zhou, P. Saffari, C. Mou, L. Zhang, S. He, and I. Bennion, IEEE Photon. Technol. Lett. 20, 1609 (2008).

Hong, W.

Iadicicco, A.

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Kim, D. K.

M. Park, S. Lee, W. Ha, D. K. Kim, W. Shin, I. B. Sohn, and K. Oh, IEEE Photon Technol. Lett. 21, 1027 (2009).

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Lee, S.

M. Park, S. Lee, W. Ha, D. K. Kim, W. Shin, I. B. Sohn, and K. Oh, IEEE Photon Technol. Lett. 21, 1027 (2009).

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Y. Yu, L. Jiang, B. Li, S. Wang, and H. Wu, Chin. Opt. Lett. 10, 122801 (2012).

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Li, Y.

Li, Y. J.

Lin, C. H.

Lin, N.

Liu, S.

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Z. B. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).

Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

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M. Park, S. Lee, W. Ha, D. K. Kim, W. Shin, I. B. Sohn, and K. Oh, IEEE Photon Technol. Lett. 21, 1027 (2009).

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N.M. Hanumegowda, C. J. Stica, B. C. Patel, I. M. White, and X. Fan, Appl. Phys. Lett. 87, 201107 (2005).

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H. Fu, K. Zhou, P. Saffari, C. Mou, L. Zhang, S. He, and I. Bennion, IEEE Photon. Technol. Lett. 20, 1609 (2008).

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M. Park, S. Lee, W. Ha, D. K. Kim, W. Shin, I. B. Sohn, and K. Oh, IEEE Photon Technol. Lett. 21, 1027 (2009).

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M. Park, S. Lee, W. Ha, D. K. Kim, W. Shin, I. B. Sohn, and K. Oh, IEEE Photon Technol. Lett. 21, 1027 (2009).

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N.M. Hanumegowda, C. J. Stica, B. C. Patel, I. M. White, and X. Fan, Appl. Phys. Lett. 87, 201107 (2005).

Sugden, K.

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S. W. James and R. P. Tatam, Meas Sci Technol. 14, R49 (2003).

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Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

Z. B. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).

Tong, L.

Tsai, H. L.

Wang, D. N.

Wang, S.

Wang, S. M.

Wang, Y.

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T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).

Wei, T.

White, I. M.

I. M. White and X. Fan, Opt. Express 16, 1020 (2008).

N.M. Hanumegowda, C. J. Stica, B. C. Patel, I. M. White, and X. Fan, Appl. Phys. Lett. 87, 201107 (2005).

Wu, H.

Xiao, H.

Yam, S. S-H.

Z. B. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).

Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

Yan, Z.

Yang, J. P.

Yang, M.

Yang, X. C.

Yu, Y.

Yuan, L.

Zhang, L.

Zhao, L. J.

Zhou, K.

Zhou, L. Y.

B. Li, L. Jiang, S. Wang, L. Y. Zhou, H. Xiao, and H. L. Tsai, Sensors 11, 5729 (2011).

Zhu, T.

Appl. Opt.

Appl. Phys. Lett.

N.M. Hanumegowda, C. J. Stica, B. C. Patel, I. M. White, and X. Fan, Appl. Phys. Lett. 87, 201107 (2005).

Chin. Opt. Lett.

IEEE Photon Technol. Lett.

Z. B. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon Technol. Lett. 20, 626 (2008).

M. Park, S. Lee, W. Ha, D. K. Kim, W. Shin, I. B. Sohn, and K. Oh, IEEE Photon Technol. Lett. 21, 1027 (2009).

IEEE Photon. Technol. Lett.

A. Iadicicco, A. Cusano, A. Cutolo, R. Bernini, and M. Giordano, IEEE Photon. Technol. Lett. 16, 1149 (2004).

H. Fu, K. Zhou, P. Saffari, C. Mou, L. Zhang, S. He, and I. Bennion, IEEE Photon. Technol. Lett. 20, 1609 (2008).

J. Appl. Phy.

L. Jiang and H. L. Tsai, J. Appl. Phy. 100, 023116 (2006).

J. Opt. Soc. Am. B

Meas Sci Technol.

S. W. James and R. P. Tatam, Meas Sci Technol. 14, R49 (2003).

Opt. Express

Opt. Lett.

Rev. Sci. Instrum.

T. Allsop, R. Reeves, D. J. Webb, I. Bennion, and R. Neal, Rev. Sci. Instrum. 73, 1702 (2002).

Sensors

B. Li, L. Jiang, S. Wang, L. Y. Zhou, H. Xiao, and H. L. Tsai, Sensors 11, 5729 (2011).

Other

Relationship between Salt Solution and Sugar Concentration (Brix) and refractive index at 20 oC. Available online: http://www.topac.com/salinity brix.html (accessed on 12 August 2011).

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