Abstract

Calibrating a small field camera is a challenging task because the traditional target with visible feature points that fit the limited space is difficult and costly to manufacture. We demonstrate a novel combined target used in camera calibration. The tangent points supplied by one circle located at the center of a square are used as invisible features, and the perspective projection invariance is proved. Both visible and invisible features extracted by the proposed feature extraction algorithm are used to solve the calibration. The target supplies a sufficient number of feature points to satisfy the requirements of calibration within a limited space. Experiments show that the approach can achieve high robustness and considerable accuracy. This approach has potential for computer vision applications particularly in small fields of view.

© 2012 Chinese Optics Letters

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2010 (2)

I. Miyagawa, H. Arai, and H. Koike, IEEE Trans. Image Process. 6, 1528 (2010).

H. Cui, W. Liao, X. Cheng, N. Dai, and T. Yuan, Chin. Opt. Lett. 8, 33 (2010).

2009 (1)

W. Ma, Y. Zheng, and Y. Liu, Opt. Eng. 5, 053602 (2009).

2008 (2)

F. Zhou and W. Zhang, Proc. SPIE 7129, 71290C (2008).

M. Fiala and C. Shu, Mach. Vis. Appl. 19, 209 (2008).

2005 (3)

J. Kim, P. Gurdjos, and I. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 4, 637 (2005).

C. Sun, X. Zhang, and Y. Qu, Chin. Opt. Lett. 3, 585 (2005).

Z. Chen and P. Shi, Chin. Opt. Lett. 3, 69 (2005).

2003 (1)

X. Meng and Z. Hu, Pattern Recogn. 36, 1155 (2003).

2002 (1)

J. Salvi, X. Armangue, and J. Batlle, Pattern Recogn. 35, 1617 (2002).

2000 (1)

Z. Zhang, IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330 (2000).

1992 (1)

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Mach. Intell. 10, 965 (1992).

Arai, H.

I. Miyagawa, H. Arai, and H. Koike, IEEE Trans. Image Process. 6, 1528 (2010).

Armangue, X.

J. Salvi, X. Armangue, and J. Batlle, Pattern Recogn. 35, 1617 (2002).

Batlle, J.

J. Salvi, X. Armangue, and J. Batlle, Pattern Recogn. 35, 1617 (2002).

Chen, Z.

Cheng, X.

Cohen, P.

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Mach. Intell. 10, 965 (1992).

Cui, H.

Dai, N.

Fiala, M.

M. Fiala and C. Shu, Mach. Vis. Appl. 19, 209 (2008).

Gurdjos, P.

J. Kim, P. Gurdjos, and I. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 4, 637 (2005).

Herniou, M.

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Mach. Intell. 10, 965 (1992).

Hu, Z.

X. Meng and Z. Hu, Pattern Recogn. 36, 1155 (2003).

Kim, J.

J. Kim, P. Gurdjos, and I. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 4, 637 (2005).

Koike, H.

I. Miyagawa, H. Arai, and H. Koike, IEEE Trans. Image Process. 6, 1528 (2010).

Kweon, I.

J. Kim, P. Gurdjos, and I. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 4, 637 (2005).

Liao, W.

Liu, Y.

W. Ma, Y. Zheng, and Y. Liu, Opt. Eng. 5, 053602 (2009).

Ma, W.

W. Ma, Y. Zheng, and Y. Liu, Opt. Eng. 5, 053602 (2009).

Meng, X.

X. Meng and Z. Hu, Pattern Recogn. 36, 1155 (2003).

Miyagawa, I.

I. Miyagawa, H. Arai, and H. Koike, IEEE Trans. Image Process. 6, 1528 (2010).

Qu, Y.

Salvi, J.

J. Salvi, X. Armangue, and J. Batlle, Pattern Recogn. 35, 1617 (2002).

Shi, P.

Shu, C.

M. Fiala and C. Shu, Mach. Vis. Appl. 19, 209 (2008).

Sun, C.

Weng, J.

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Mach. Intell. 10, 965 (1992).

Yuan, T.

Zhang, W.

F. Zhou and W. Zhang, Proc. SPIE 7129, 71290C (2008).

Zhang, X.

Zhang, Z.

Z. Zhang, IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330 (2000).

Zheng, Y.

W. Ma, Y. Zheng, and Y. Liu, Opt. Eng. 5, 053602 (2009).

Zhou, F.

F. Zhou and W. Zhang, Proc. SPIE 7129, 71290C (2008).

Chin. Opt. Lett. (3)

IEEE Trans. Image Process. (1)

I. Miyagawa, H. Arai, and H. Koike, IEEE Trans. Image Process. 6, 1528 (2010).

IEEE Trans. Pattern Anal. Mach. Intell. (3)

Z. Zhang, IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330 (2000).

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Mach. Intell. 10, 965 (1992).

J. Kim, P. Gurdjos, and I. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 4, 637 (2005).

Mach. Vis. Appl. (1)

M. Fiala and C. Shu, Mach. Vis. Appl. 19, 209 (2008).

Opt. Eng. (1)

W. Ma, Y. Zheng, and Y. Liu, Opt. Eng. 5, 053602 (2009).

Pattern Recogn. (2)

X. Meng and Z. Hu, Pattern Recogn. 36, 1155 (2003).

J. Salvi, X. Armangue, and J. Batlle, Pattern Recogn. 35, 1617 (2002).

Proc. SPIE (1)

F. Zhou and W. Zhang, Proc. SPIE 7129, 71290C (2008).

Other (4)

L. Zhang, J. Zhang, and Y. Hu, in Proceedings of International Conference on Information and Automation 352 (2009).

J. Heikkila and O. SilvCn, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognitions 1106 (1997).

Z. Yang, F. Chen, J. Zhao, and H. Zhao, in Proceedings of the Third IEEE Conference on Industrial Electronics and Applications 2222 (2008).

H. Richard and Z. Andrew, Multiple View Geometry in Computer Vision (Cambridge University Press, Cambridge, 2000).

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