Abstract

The mean-shift algorithm has achieved considerable success in object tracking due to its simplicity and efficiency. Color histogram is a common feature in the description of an object. However, the kernel-based color histogram may not have the ability to discriminate the object from clutter background. To boost the discriminating ability of the feature, based on background contrasting, this letter presents an improved Bhattacharyya similarity metric for mean-shift tracking. Experiments show that the proposed tracker is more robust in relation to background clutter.

© 2012 Chinese Optics Letters

PDF Article

References

  • View by:
  • |
  • |
  • |

  1. Y. Cheng, IEEE Trans. Pattern Anal. Mach. Intel. 17, 790 (1995).
  2. D. Comaniciu, IEEE Trans. Pattern Anal. Mach. Intel. 25, 281 (2003).
  3. B. Georgescu, I. Shimshoni, and P. Meer, in Proceedings of Ninth IEEE International Conference on Computer Vision 1, 456 ( 2003).
  4. D. Comaniciu and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 24, 603 (2002).
  5. D. Comaniciu, V. Ramesh, and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 25, 564 (2003).
  6. I. Leichter, M. Lindenbaum, and E. Rivlin, Computer Vis. Image Und. 114, 400 (2010).
  7. C. Shen, J. Kim, and H. Wang, IEEE Trans. Circ. Syst. Vid. 20, 119 (2010).
  8. P. Wang and H. Qiao, IEEE Trans. Circ. Syst. Vid. 21, 156 (2011).
  9. J. Tu, H. Tao, and T. Huang, in Proceedings of International Conference on Computer Vision 3851, 694 (2006).
  10. C. Shen, M. Brooks, and A. Van Den Hengel, IEEE Trans. Image Process 16, 1457 (2007).
  11. R. T. Collins, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 234 (2003).
  12. E. Maggio and A. Cavallaro, Computer Vis. Image Und. 113, 544 (2009).
  13. F. Wang, S. Yu, and J. Yang, Int. J. Electron. Comm. 64, 614 (2010).
  14. S. Birchfield and S. Rangarajan, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 1158 (2005).
  15. J. Jeyakar, R. V. Babu, and K. R. Ramakrishnan, Computer Vis. Image Und. 112, 296 (2008).
  16. C. Yang, R. Duraiswami, and L. Davis, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 176 (2005).
  17. J. S. Hu, C. W. Juan, and J. J. Wang, Pattern Recogn. Lett. 29, 2165 (2008).

2011 (1)

P. Wang and H. Qiao, IEEE Trans. Circ. Syst. Vid. 21, 156 (2011).

2010 (3)

I. Leichter, M. Lindenbaum, and E. Rivlin, Computer Vis. Image Und. 114, 400 (2010).

C. Shen, J. Kim, and H. Wang, IEEE Trans. Circ. Syst. Vid. 20, 119 (2010).

F. Wang, S. Yu, and J. Yang, Int. J. Electron. Comm. 64, 614 (2010).

2009 (1)

E. Maggio and A. Cavallaro, Computer Vis. Image Und. 113, 544 (2009).

2008 (2)

J. S. Hu, C. W. Juan, and J. J. Wang, Pattern Recogn. Lett. 29, 2165 (2008).

J. Jeyakar, R. V. Babu, and K. R. Ramakrishnan, Computer Vis. Image Und. 112, 296 (2008).

2007 (1)

C. Shen, M. Brooks, and A. Van Den Hengel, IEEE Trans. Image Process 16, 1457 (2007).

2006 (1)

J. Tu, H. Tao, and T. Huang, in Proceedings of International Conference on Computer Vision 3851, 694 (2006).

2005 (2)

S. Birchfield and S. Rangarajan, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 1158 (2005).

C. Yang, R. Duraiswami, and L. Davis, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 176 (2005).

2003 (3)

R. T. Collins, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 234 (2003).

D. Comaniciu, IEEE Trans. Pattern Anal. Mach. Intel. 25, 281 (2003).

D. Comaniciu, V. Ramesh, and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 25, 564 (2003).

2002 (1)

D. Comaniciu and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 24, 603 (2002).

1995 (1)

Y. Cheng, IEEE Trans. Pattern Anal. Mach. Intel. 17, 790 (1995).

Babu, R. V.

J. Jeyakar, R. V. Babu, and K. R. Ramakrishnan, Computer Vis. Image Und. 112, 296 (2008).

Birchfield, S.

S. Birchfield and S. Rangarajan, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 1158 (2005).

Brooks, M.

C. Shen, M. Brooks, and A. Van Den Hengel, IEEE Trans. Image Process 16, 1457 (2007).

Cavallaro, A.

E. Maggio and A. Cavallaro, Computer Vis. Image Und. 113, 544 (2009).

Cheng, Y.

Y. Cheng, IEEE Trans. Pattern Anal. Mach. Intel. 17, 790 (1995).

Collins, R. T.

R. T. Collins, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 234 (2003).

Comaniciu, D.

D. Comaniciu, V. Ramesh, and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 25, 564 (2003).

D. Comaniciu, IEEE Trans. Pattern Anal. Mach. Intel. 25, 281 (2003).

D. Comaniciu and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 24, 603 (2002).

Davis, L.

C. Yang, R. Duraiswami, and L. Davis, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 176 (2005).

Duraiswami, R.

C. Yang, R. Duraiswami, and L. Davis, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 176 (2005).

Hengel, A. Van Den

C. Shen, M. Brooks, and A. Van Den Hengel, IEEE Trans. Image Process 16, 1457 (2007).

Hu, J. S.

J. S. Hu, C. W. Juan, and J. J. Wang, Pattern Recogn. Lett. 29, 2165 (2008).

Huang, T.

J. Tu, H. Tao, and T. Huang, in Proceedings of International Conference on Computer Vision 3851, 694 (2006).

Jeyakar, J.

J. Jeyakar, R. V. Babu, and K. R. Ramakrishnan, Computer Vis. Image Und. 112, 296 (2008).

Juan, C. W.

J. S. Hu, C. W. Juan, and J. J. Wang, Pattern Recogn. Lett. 29, 2165 (2008).

Kim, J.

C. Shen, J. Kim, and H. Wang, IEEE Trans. Circ. Syst. Vid. 20, 119 (2010).

Leichter, I.

I. Leichter, M. Lindenbaum, and E. Rivlin, Computer Vis. Image Und. 114, 400 (2010).

Lindenbaum, M.

I. Leichter, M. Lindenbaum, and E. Rivlin, Computer Vis. Image Und. 114, 400 (2010).

Maggio, E.

E. Maggio and A. Cavallaro, Computer Vis. Image Und. 113, 544 (2009).

Meer, P.

D. Comaniciu, V. Ramesh, and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 25, 564 (2003).

D. Comaniciu and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 24, 603 (2002).

Qiao, H.

P. Wang and H. Qiao, IEEE Trans. Circ. Syst. Vid. 21, 156 (2011).

Ramakrishnan, K. R.

J. Jeyakar, R. V. Babu, and K. R. Ramakrishnan, Computer Vis. Image Und. 112, 296 (2008).

Ramesh, V.

D. Comaniciu, V. Ramesh, and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 25, 564 (2003).

Rangarajan, S.

S. Birchfield and S. Rangarajan, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 1158 (2005).

Rivlin, E.

I. Leichter, M. Lindenbaum, and E. Rivlin, Computer Vis. Image Und. 114, 400 (2010).

Shen, C.

C. Shen, J. Kim, and H. Wang, IEEE Trans. Circ. Syst. Vid. 20, 119 (2010).

C. Shen, M. Brooks, and A. Van Den Hengel, IEEE Trans. Image Process 16, 1457 (2007).

Tao, H.

J. Tu, H. Tao, and T. Huang, in Proceedings of International Conference on Computer Vision 3851, 694 (2006).

Tu, J.

J. Tu, H. Tao, and T. Huang, in Proceedings of International Conference on Computer Vision 3851, 694 (2006).

Wang, F.

F. Wang, S. Yu, and J. Yang, Int. J. Electron. Comm. 64, 614 (2010).

Wang, H.

C. Shen, J. Kim, and H. Wang, IEEE Trans. Circ. Syst. Vid. 20, 119 (2010).

Wang, J. J.

J. S. Hu, C. W. Juan, and J. J. Wang, Pattern Recogn. Lett. 29, 2165 (2008).

Wang, P.

P. Wang and H. Qiao, IEEE Trans. Circ. Syst. Vid. 21, 156 (2011).

Yang, C.

C. Yang, R. Duraiswami, and L. Davis, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 176 (2005).

Yang, J.

F. Wang, S. Yu, and J. Yang, Int. J. Electron. Comm. 64, 614 (2010).

Yu, S.

F. Wang, S. Yu, and J. Yang, Int. J. Electron. Comm. 64, 614 (2010).

Computer Vis. Image Und. (3)

I. Leichter, M. Lindenbaum, and E. Rivlin, Computer Vis. Image Und. 114, 400 (2010).

E. Maggio and A. Cavallaro, Computer Vis. Image Und. 113, 544 (2009).

J. Jeyakar, R. V. Babu, and K. R. Ramakrishnan, Computer Vis. Image Und. 112, 296 (2008).

IEEE Trans. Circ. Syst. Vid. (2)

C. Shen, J. Kim, and H. Wang, IEEE Trans. Circ. Syst. Vid. 20, 119 (2010).

P. Wang and H. Qiao, IEEE Trans. Circ. Syst. Vid. 21, 156 (2011).

IEEE Trans. Image Process (1)

C. Shen, M. Brooks, and A. Van Den Hengel, IEEE Trans. Image Process 16, 1457 (2007).

IEEE Trans. Pattern Anal. Mach. Intel. (4)

Y. Cheng, IEEE Trans. Pattern Anal. Mach. Intel. 17, 790 (1995).

D. Comaniciu, IEEE Trans. Pattern Anal. Mach. Intel. 25, 281 (2003).

D. Comaniciu and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 24, 603 (2002).

D. Comaniciu, V. Ramesh, and P. Meer, IEEE Trans. Pattern Anal. Mach. Intel. 25, 564 (2003).

in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition (1)

C. Yang, R. Duraiswami, and L. Davis, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 176 (2005).

in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition (2)

S. Birchfield and S. Rangarajan, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 1158 (2005).

R. T. Collins, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2, 234 (2003).

in Proceedings of International Conference on Computer Vision (1)

J. Tu, H. Tao, and T. Huang, in Proceedings of International Conference on Computer Vision 3851, 694 (2006).

Int. J. Electron. Comm. (1)

F. Wang, S. Yu, and J. Yang, Int. J. Electron. Comm. 64, 614 (2010).

Pattern Recogn. Lett. (1)

J. S. Hu, C. W. Juan, and J. J. Wang, Pattern Recogn. Lett. 29, 2165 (2008).

Other (1)

B. Georgescu, I. Shimshoni, and P. Meer, in Proceedings of Ninth IEEE International Conference on Computer Vision 1, 456 ( 2003).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.