Abstract

The maximum output power offiber lasers limited by the thermal degradation of double-clad fiber coatings is theoretically simulated. We investigated the thermal effects on high-power continuous wave (CW) fiber lasers with a focus on heating at the splice joints as well as on the doped fiber caused by quantum defects. Whether thermal interface materials are used or not, the thermal contact resistances between the fiber and its heat sink are measured separately while using different cooling equipments. Though the thermal management of splices is more difficult than that of active fibers, a temperature increase of 0.019 K/W is obtained for a splice joint into which the pump light launches. The splice joint sustains 3 kW of total passing power.

© 2012 Chinese Optics Letters

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  1. B. Zhao, K. Duan, W. Zhao, C. Li, and Y. Wang, Chin. Opt. Lett. 8, 404 (2010).
  2. X. Dong, H. Xiao, S. Xu, Z. Pan, Y. Ma, X. Wang, P. Zhou, and Z. Yang, Chin. Opt. Lett. 9, 111404 (2011).
  3. C.Wirth, O. Schmidt, I. Tsybin, T. Schreiber, T. Peschel, F. Br�uckner, T. Clausnitzer, J. Limpert, R. Eberhardt, A. T�unnermann, M. Gowin, E. ten Have, K. Ludewigt, and M. Jung, Opt. Express 17, 1178 (2009).
  4. D. C. Brown and H. J. Hoffman, IEEE J. Sel. Top. Quantum Electron. 37, 207 (2001).
  5. Y. Wang, C. Q. Xu, and H. Po, IEEE Photon. Technol. Lett. 16, 63 (2004).
  6. N. A. Brilliant and K. Lagonik, Opt. Lett. 26, 1669 (2001).
  7. M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).
  8. Y. Fan, B. He, J. Zhou, J. Zheng, H. Liu, Y. Wei, Y. Dong, and Q. Lou, Opt. Express 19, 15162 (2011).
  9. B. Zintzen, T. Langer, J. Geiger, D. Hoffmann, and P. Loosen, Opt. Express 15, 16787 (2007).
  10. J. P. Gwinn and R. L. Webb, Microelectron. J. 34, 215 (2003).
  11. J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).
  12. P. Yan, A. Xu, and M. Gong, Opt. Eng. 45, 124201 (2006).

2011 (2)

2010 (1)

2009 (3)

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

C.Wirth, O. Schmidt, I. Tsybin, T. Schreiber, T. Peschel, F. Br�uckner, T. Clausnitzer, J. Limpert, R. Eberhardt, A. T�unnermann, M. Gowin, E. ten Have, K. Ludewigt, and M. Jung, Opt. Express 17, 1178 (2009).

J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).

2007 (1)

2006 (1)

P. Yan, A. Xu, and M. Gong, Opt. Eng. 45, 124201 (2006).

2004 (1)

Y. Wang, C. Q. Xu, and H. Po, IEEE Photon. Technol. Lett. 16, 63 (2004).

2003 (1)

J. P. Gwinn and R. L. Webb, Microelectron. J. 34, 215 (2003).

2001 (2)

N. A. Brilliant and K. Lagonik, Opt. Lett. 26, 1669 (2001).

D. C. Brown and H. J. Hoffman, IEEE J. Sel. Top. Quantum Electron. 37, 207 (2001).

Br?uckner, F.

Brilliant, N. A.

Brown, D. C.

D. C. Brown and H. J. Hoffman, IEEE J. Sel. Top. Quantum Electron. 37, 207 (2001).

Cain-Skaff, M.

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

Chatigny, S.

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

Clarkson, andW. Andrew

J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).

Clausnitzer, T.

Dong, X.

Dong, Y.

Duan, K.

Eberhardt, R.

Fan, Y.

Geiger, J.

Gong, M.

P. Yan, A. Xu, and M. Gong, Opt. Eng. 45, 124201 (2006).

Gowin, M.

Gwinn, J. P.

J. P. Gwinn and R. L. Webb, Microelectron. J. 34, 215 (2003).

Have, E. ten

He, B.

Hoffman, H. J.

D. C. Brown and H. J. Hoffman, IEEE J. Sel. Top. Quantum Electron. 37, 207 (2001).

Hoffmann, D.

Jung, M.

Kim, J.W.

J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).

Lagonik, K.

Langer, T.

Lapointe, M.-A.

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

Li, C.

Limpert, J.

Liu, H.

Loosen, P.

Lou, Q.

Ludewigt, K.

Ma, Y.

Maran, J.-N.

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

Pan, Z.

Peschel, T.

Piche, M.

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

Po, H.

Y. Wang, C. Q. Xu, and H. Po, IEEE Photon. Technol. Lett. 16, 63 (2004).

Sahu, Jayanta K.

J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).

Schmidt, O.

Schreiber, T.

Shen, D. Y.

J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).

T?unnermann, A.

Tsybin, I.

Wang, X.

Wang, Y.

B. Zhao, K. Duan, W. Zhao, C. Li, and Y. Wang, Chin. Opt. Lett. 8, 404 (2010).

Y. Wang, C. Q. Xu, and H. Po, IEEE Photon. Technol. Lett. 16, 63 (2004).

Webb, R. L.

J. P. Gwinn and R. L. Webb, Microelectron. J. 34, 215 (2003).

Wei, Y.

Xiao, H.

Xu, A.

P. Yan, A. Xu, and M. Gong, Opt. Eng. 45, 124201 (2006).

Xu, C. Q.

Y. Wang, C. Q. Xu, and H. Po, IEEE Photon. Technol. Lett. 16, 63 (2004).

Xu, S.

Yan, P.

P. Yan, A. Xu, and M. Gong, Opt. Eng. 45, 124201 (2006).

Yang, Z.

Zhao, B.

Zhao, W.

Zheng, J.

Zhou, J.

Zhou, P.

Zintzen, B.

Chin. Opt. Lett. (2)

IEEE J. Sel. Top. Quantum Electron. (2)

D. C. Brown and H. J. Hoffman, IEEE J. Sel. Top. Quantum Electron. 37, 207 (2001).

J.W. Kim, D. Y. Shen, Jayanta K. Sahu, andW. Andrew Clarkson, IEEE J. Sel. Top. Quantum Electron. 15, 361 (2009).

IEEE Photon. Technol. Lett. (1)

Y. Wang, C. Q. Xu, and H. Po, IEEE Photon. Technol. Lett. 16, 63 (2004).

Microelectron. J. (1)

J. P. Gwinn and R. L. Webb, Microelectron. J. 34, 215 (2003).

Opt. Eng. (1)

P. Yan, A. Xu, and M. Gong, Opt. Eng. 45, 124201 (2006).

Opt. Express (3)

Opt. Lett. (1)

Proc. SPIE (1)

M.-A. Lapointe, S. Chatigny, M. Piche, M. Cain-Skaff, and J.-N. Maran, Proc. SPIE 7195, 719511 (2009).

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