Abstract

High-power polarization-division-multiplexing (PDM) systems or functional modules, such as self-phasemodulation (SPM)-based all-optical regenerators, cross-phase-modulation (XPM)-based wavelength convertors or format convertors, all-optical logical gate, and so on, may suffer from the effects of pattern dependence. Such effects are experimentally investigated using relative time delay variation between bit sequences with orthogonal polarization states in a 2 x 10.65 Gb/s high-power on-off keying (OOK) PDM system. Eye-diagram-based signal-to-noise ratio (SNR) and bandwidth of broadened spectrum are measured and compared. An eye-diagram-based SNR fluctuation of up to 4 dB may occur as the delay changes.

© 2012 Chinese Optics Letters

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