Abstract

In this paper, we propose a method of digital in-line holography of particle. A diverging spherical beam is used for illumination in recording hologram, the complex amplitude distribution generated by particle field at a single plane located in the Fresnel diffraction region is recorded by CCD, and a plane beam for reconstructing hologram, then, the magnified image can be obtained by numerical reconstruction in computer. This procedure can be interpreted by Fourier optical theory and the theoretical analysis have been done in detail, the experimental results, the air freshener being subject, are also given.

© 2005 Chinese Optics Letters

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  1. J. D. Trolinger, Opt. Eng. 14, 383 (1975).
  2. M. Adams, T. Kreis, and W. Juptner, Proc. SPIE 3823, 38 (1999).
  3. V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).
  4. S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).
  5. R. B. Owen and A. A. Zozulya, Opt. Eng. 39, 2187 (2000).
  6. C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).
  7. S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).
  8. H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).
  9. Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).
  10. B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).
  11. I. Yamaguchi, J. Kato, S. Ohta, and J. Mizuno, Appl. Opt. 40, 6177 (2001).
  12. W. Xu, M. H. Jericho, A. Meinertzhagen, and H. J. Kreuzer, Appl. Opt. 41, 5367 (2002).

2002 (3)

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

W. Xu, M. H. Jericho, A. Meinertzhagen, and H. J. Kreuzer, Appl. Opt. 41, 5367 (2002).

2001 (3)

I. Yamaguchi, J. Kato, S. Ohta, and J. Mizuno, Appl. Opt. 40, 6177 (2001).

S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).

H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).

2000 (3)

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).

R. B. Owen and A. A. Zozulya, Opt. Eng. 39, 2187 (2000).

C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).

1999 (2)

M. Adams, T. Kreis, and W. Juptner, Proc. SPIE 3823, 38 (1999).

V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).

1975 (1)

J. D. Trolinger, Opt. Eng. 14, 383 (1975).

Adams, M.

V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).

M. Adams, T. Kreis, and W. Juptner, Proc. SPIE 3823, 38 (1999).

Coetmellec, S.

S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).

C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).

Ge, B. Z.

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

Hartmann, H. J.

V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).

Jericho, M. H.

Jericho, M. J.

H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).

Juptner, W.

V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).

M. Adams, T. Kreis, and W. Juptner, Proc. SPIE 3823, 38 (1999).

Kato, J.

Kebbel, V.

V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).

Kreis, T.

M. Adams, T. Kreis, and W. Juptner, Proc. SPIE 3823, 38 (1999).

Kreuzer, H. J.

W. Xu, M. H. Jericho, A. Meinertzhagen, and H. J. Kreuzer, Appl. Opt. 41, 5367 (2002).

H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).

Lebrun, D.

S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).

C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).

Lefebvre, C. B.

S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).

C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).

Lu, Q. N.

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

Luo, W. G.

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Meinertzhagen, A.

Meinertzhagen, I. A.

H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).

Mizuno, J.

Murata, S.

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).

Ohta, S.

Owen, R. B.

R. B. Owen and A. A. Zozulya, Opt. Eng. 39, 2187 (2000).

Ozkul, C.

S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).

C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).

Qiao, P.

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

Trolinger, J. D.

J. D. Trolinger, Opt. Eng. 14, 383 (1975).

Xu, W.

W. Xu, M. H. Jericho, A. Meinertzhagen, and H. J. Kreuzer, Appl. Opt. 41, 5367 (2002).

H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).

Yamaguchi, I.

Yasuda, N.

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).

Zhang, Y. M.

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Zhao, H. Y.

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

Zozulya, A. A.

R. B. Owen and A. A. Zozulya, Opt. Eng. 39, 2187 (2000).

Appl. Opt. (2)

J. Phy.: Condens. Matter (1)

H. J. Kreuzer, M. J. Jericho, I. A. Meinertzhagen, and W. Xu, J. Phy.: Condens. Matter 13, 10729 (2001).

Meas. Sci. Technol. (2)

V. Kebbel, M. Adams, H. J. Hartmann, and W. Juptner, Meas. Sci. Technol. 10, 893 (1999).

S. Coetmellec, C. B. Lefebvre, D. Lebrun, and C. Ozkul, Meas. Sci. Technol. 12, 1392 (2001).

Opt. Eng. (2)

J. D. Trolinger, Opt. Eng. 14, 383 (1975).

R. B. Owen and A. A. Zozulya, Opt. Eng. 39, 2187 (2000).

Opt. Laser Eng. (1)

C. B. Lefebvre, S. Coetmellec, D. Lebrun, and C. Ozkul, Opt. Laser Eng. 33, 409 (2000).

Opt. Laser Technol. (1)

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).

Proc. ISTP (1)

B. Z. Ge, Q. N. Lu, Y. M. Zhang, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. ISTP 3, 451 (2002).

Proc. SPIE (2)

M. Adams, T. Kreis, and W. Juptner, Proc. SPIE 3823, 38 (1999).

Q. N. Lu, Y. M. Zhang, B. Z. Ge, H. Y. Zhao, W. G. Luo, and P. Qiao, Proc. SPIE 4929, 481 (2002).

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