Abstract

A new method for natural color image segmentation using integrated mechanism is proposed in this paper. Edges are first detected in term of the high phase congruency in the gray-level image. K-mean cluster is used to label long edge lines based on the global color information to estimate roughly the distribution of objects in the image, while short ones are merged based on their positions and local color differences to eliminate the negative affection caused by texture or other trivial features in image. Region growing technique is employed to achieve final segmentation results. The proposed method unifies edges, whole and local color distributions, as well as spatial information to solve the natural image segmentation problem.The feasibility and effectiveness of this method have been demonstrated by various experiments.

© 2005 Chinese Optics Letters

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  1. W. Y. Ma and B. S. Manjunath, IEEE Trans. Image Processing 9, 1375 (2000).
  2. Y. Deng and B. S. Manjunath, IEEE Trans. Pattern Analysis and Machine Intelligence 23, 800 (2001).
  3. M. Mirmehdi and M. Petrou, IEEE Trans. Pattern Analysis and Machine Intelligence 22, 142 (2000).
  4. J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).
  5. K.-M. Chen and S.-Y. Chen, Pattern Recognition Lett. 23, 755 (2002).
  6. J. Canny, IEEE Trans. Pattern Analysis and Machine Intelligence 8, 679 (1986).
  7. M. C. Morrone and R. A. Owens, Pattern Recognition Lett. 6, 303 (1987).
  8. P. Kovesi, Videre: J. Computer Vision Research 1 (3), 1 (1999).
  9. M. J. Swain and D. H. Ballard, J. Computer Vision 7, 11 (1991).

2002 (1)

K.-M. Chen and S.-Y. Chen, Pattern Recognition Lett. 23, 755 (2002).

2001 (2)

Y. Deng and B. S. Manjunath, IEEE Trans. Pattern Analysis and Machine Intelligence 23, 800 (2001).

J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).

2000 (2)

W. Y. Ma and B. S. Manjunath, IEEE Trans. Image Processing 9, 1375 (2000).

M. Mirmehdi and M. Petrou, IEEE Trans. Pattern Analysis and Machine Intelligence 22, 142 (2000).

1991 (1)

M. J. Swain and D. H. Ballard, J. Computer Vision 7, 11 (1991).

1987 (1)

M. C. Morrone and R. A. Owens, Pattern Recognition Lett. 6, 303 (1987).

1986 (1)

J. Canny, IEEE Trans. Pattern Analysis and Machine Intelligence 8, 679 (1986).

Aref, W. G.

J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).

Ballard, D. H.

M. J. Swain and D. H. Ballard, J. Computer Vision 7, 11 (1991).

Canny, J.

J. Canny, IEEE Trans. Pattern Analysis and Machine Intelligence 8, 679 (1986).

Chen, K.-M.

K.-M. Chen and S.-Y. Chen, Pattern Recognition Lett. 23, 755 (2002).

Chen, S.-Y.

K.-M. Chen and S.-Y. Chen, Pattern Recognition Lett. 23, 755 (2002).

Deng, Y.

Y. Deng and B. S. Manjunath, IEEE Trans. Pattern Analysis and Machine Intelligence 23, 800 (2001).

Elmagarmid, A. K.

J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).

Fan, J.

J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).

Ma, W. Y.

W. Y. Ma and B. S. Manjunath, IEEE Trans. Image Processing 9, 1375 (2000).

Manjunath, B. S.

Y. Deng and B. S. Manjunath, IEEE Trans. Pattern Analysis and Machine Intelligence 23, 800 (2001).

W. Y. Ma and B. S. Manjunath, IEEE Trans. Image Processing 9, 1375 (2000).

Mirmehdi, M.

M. Mirmehdi and M. Petrou, IEEE Trans. Pattern Analysis and Machine Intelligence 22, 142 (2000).

Morrone, M. C.

M. C. Morrone and R. A. Owens, Pattern Recognition Lett. 6, 303 (1987).

Owens, R. A.

M. C. Morrone and R. A. Owens, Pattern Recognition Lett. 6, 303 (1987).

Petrou, M.

M. Mirmehdi and M. Petrou, IEEE Trans. Pattern Analysis and Machine Intelligence 22, 142 (2000).

Swain, M. J.

M. J. Swain and D. H. Ballard, J. Computer Vision 7, 11 (1991).

Yau, D. K. Y.

J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).

IEEE Trans. Image Processing (2)

W. Y. Ma and B. S. Manjunath, IEEE Trans. Image Processing 9, 1375 (2000).

J. Fan, D. K. Y. Yau, A. K. Elmagarmid, and W. G. Aref, IEEE Trans. Image Processing 10, 1454 (2001).

IEEE Trans. Pattern Analysis and Machine Intelligence (3)

Y. Deng and B. S. Manjunath, IEEE Trans. Pattern Analysis and Machine Intelligence 23, 800 (2001).

M. Mirmehdi and M. Petrou, IEEE Trans. Pattern Analysis and Machine Intelligence 22, 142 (2000).

J. Canny, IEEE Trans. Pattern Analysis and Machine Intelligence 8, 679 (1986).

J. Computer Vision (1)

M. J. Swain and D. H. Ballard, J. Computer Vision 7, 11 (1991).

Pattern Recognition Lett. (2)

M. C. Morrone and R. A. Owens, Pattern Recognition Lett. 6, 303 (1987).

K.-M. Chen and S.-Y. Chen, Pattern Recognition Lett. 23, 755 (2002).

Other (1)

P. Kovesi, Videre: J. Computer Vision Research 1 (3), 1 (1999).

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