Abstract

Noise reduction is one of the most exciting problems in electronic speckle pattern interferometry. We present a homomorphic partial differential equation filtering method for interferometry fringe patterns. The diffusion speed of the equation is determined based on the fringe density. We test the new method on the computer-simulated fringe pattern and experimentally obtain the fringe pattern, and evaluate its filtering performance. The qualitative and quantitative analysis shows that this technique can filter off the additive and multiplicative noise of the fringe patterns effectively, and avoid blurring high-density fringe. It is more capable of improving the quality of fringe patterns than the classical filtering methods.

© 2009 Chinese Optics Letters

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F. Zhang, W. Liu, C. Tang, J. Wang, and L. Ren, Chin. Opt. Lett. 6, 38 (2008).

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

2007

X. Yang, Q. Yu, and S. Fu, Opt. Commun. 274, 286 (2007).

2006

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

2005

M. Xie and Z. Wang, Modern Radar (in Chinese) 27, (9) 48 (2005).

S. Fu and Q. Yu, J. Appl. Opt. (in Chinese) 26, (4) 5 (2005).

2004

J. Chen and Y. Hong, Acta Opt. Sin. (in Chinese) 24, 1292 (2004).

G. Gilboa, N. Sochen, and Y. Y. Zeevi, IEEE Trans. Pattern Anal. Machine Intell. 26, 1020 (2004).

2003

Y. Qin, J. Chen, and H. Fan, Opt. Lasers Eng. 39, 449 (2003).

2002

1996

A. Dávila, G. H. Kaufmann, and D. Kerr, Opt. Eng. 35, 3549 (1996).

1990

P. Perona and J. Malik, IEEE Trans. Pattern Anal. Machine Intell. 12, 629 (1990).

1980

J.-S. Lee, IEEE Trans. Pattern Anal. Machine Intell. 2, 165 (1980).

Chen, J.

J. Chen and Y. Hong, Acta Opt. Sin. (in Chinese) 24, 1292 (2004).

Y. Qin, J. Chen, and H. Fan, Opt. Lasers Eng. 39, 449 (2003).

Cheng, J.

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

Dávila, A.

A. Dávila, G. H. Kaufmann, and D. Kerr, Opt. Eng. 35, 3549 (1996).

Fan, H.

Y. Qin, J. Chen, and H. Fan, Opt. Lasers Eng. 39, 449 (2003).

Fu, S.

X. Yang, Q. Yu, and S. Fu, Opt. Commun. 274, 286 (2007).

S. Fu and Q. Yu, J. Appl. Opt. (in Chinese) 26, (4) 5 (2005).

Gilboa, G.

G. Gilboa, N. Sochen, and Y. Y. Zeevi, IEEE Trans. Pattern Anal. Machine Intell. 26, 1020 (2004).

Hong, Y.

J. Chen and Y. Hong, Acta Opt. Sin. (in Chinese) 24, 1292 (2004).

Kaufmann, G. H.

A. Dávila, G. H. Kaufmann, and D. Kerr, Opt. Eng. 35, 3549 (1996).

Kerr, D.

A. Dávila, G. H. Kaufmann, and D. Kerr, Opt. Eng. 35, 3549 (1996).

Lee, J.-S.

J.-S. Lee, IEEE Trans. Pattern Anal. Machine Intell. 2, 165 (1980).

Li, L.

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

Liu, R.

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

Liu, W.

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

F. Zhang, W. Liu, C. Tang, J. Wang, and L. Ren, Chin. Opt. Lett. 6, 38 (2008).

Liu, X.

Malik, J.

P. Perona and J. Malik, IEEE Trans. Pattern Anal. Machine Intell. 12, 629 (1990).

Perona, P.

P. Perona and J. Malik, IEEE Trans. Pattern Anal. Machine Intell. 12, 629 (1990).

Qi, S.

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

Qian, W.

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

Qin, Y.

Y. Qin, J. Chen, and H. Fan, Opt. Lasers Eng. 39, 449 (2003).

Qiu, Z.

Ren, L.

F. Zhang, W. Liu, C. Tang, J. Wang, and L. Ren, Chin. Opt. Lett. 6, 38 (2008).

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

Sochen, N.

G. Gilboa, N. Sochen, and Y. Y. Zeevi, IEEE Trans. Pattern Anal. Machine Intell. 26, 1020 (2004).

Sun, X.

Tang, C.

Wang, J.

Wang, W.

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

Wang, Z.

M. Xie and Z. Wang, Modern Radar (in Chinese) 27, (9) 48 (2005).

Xie, M.

M. Xie and Z. Wang, Modern Radar (in Chinese) 27, (9) 48 (2005).

Yang, X.

X. Yang, Q. Yu, and S. Fu, Opt. Commun. 274, 286 (2007).

Yu, Q.

X. Yang, Q. Yu, and S. Fu, Opt. Commun. 274, 286 (2007).

S. Fu and Q. Yu, J. Appl. Opt. (in Chinese) 26, (4) 5 (2005).

Q. Yu, X. Sun, X. Liu, and Z. Qiu, Appl. Opt. 41, 2650 (2002).

Yuan, L.

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

Zeevi, Y. Y.

G. Gilboa, N. Sochen, and Y. Y. Zeevi, IEEE Trans. Pattern Anal. Machine Intell. 26, 1020 (2004).

Zhang, F.

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

F. Zhang, W. Liu, C. Tang, J. Wang, and L. Ren, Chin. Opt. Lett. 6, 38 (2008).

Acta Opt. Sin. (in Chinese)

J. Chen and Y. Hong, Acta Opt. Sin. (in Chinese) 24, 1292 (2004).

F. Zhang, W. Liu, L. Li, L. Ren, and L. Yuan, Acta Opt. Sin. (in Chinese) 28, 1475 (2008).

Appl. Opt.

Chin. Opt. Lett.

IEEE Trans. Pattern Anal. Machine Intell.

J.-S. Lee, IEEE Trans. Pattern Anal. Machine Intell. 2, 165 (1980).

P. Perona and J. Malik, IEEE Trans. Pattern Anal. Machine Intell. 12, 629 (1990).

G. Gilboa, N. Sochen, and Y. Y. Zeevi, IEEE Trans. Pattern Anal. Machine Intell. 26, 1020 (2004).

J. Appl. Opt. (in Chinese)

S. Fu and Q. Yu, J. Appl. Opt. (in Chinese) 26, (4) 5 (2005).

J. Image Graphics (in Chinese)

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, J. Image Graphics (in Chinese) 11, 818 (2006).

Modern Radar (in Chinese)

M. Xie and Z. Wang, Modern Radar (in Chinese) 27, (9) 48 (2005).

Opt. Commun.

X. Yang, Q. Yu, and S. Fu, Opt. Commun. 274, 286 (2007).

Opt. Eng.

A. Dávila, G. H. Kaufmann, and D. Kerr, Opt. Eng. 35, 3549 (1996).

Opt. Lasers Eng.

Y. Qin, J. Chen, and H. Fan, Opt. Lasers Eng. 39, 449 (2003).

Other

A. P. Witkin, in Proceedings of 8th Int. Joint Conf. Art. Intell. 1019 (1983).

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