Abstract

Laser shock peening is a well-known method for extending the fatigue life of metal components by introducing near-surface compressive residual stress. The surface acoustic waves (SAWs) are dispersive when the near-surface properties of materials are changed. So the near-surface properties (such as the thickness of hardened layers, elastic properties, residual stresses, etc.) can be analyzed by the phase velocity dispersion. To study the propagation of SAWs in metal samples after peening, a more reasonable experimental method of broadband excitation and reception is introduced. The ultrasonic signals are excited by laser and received by polyvinylindene fluoride (PVDF) transducer. The SAW signals in aluminum alloy materials with different impact times by laser shock peening are detected. Signal spectrum and phase velocity dispersion curves of SAWs are analyzed. Moreover, reasons for dispersion are discussed.

© 2008 Chinese Optics Letters

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2006 (1)

G. Yan, X. Xu, Z. Shen, J. Lu, and X. Ni, J. Optoelectronics Laser (in Chinese) 17, 107 (2006).

2005 (2)

2004 (1)

A. Ruiz and P. B. Nagy, Ultrasonics 42, 665 (2004).

2003 (2)

K. Y. Kim, W. Zou, S. Holland, and W. Sachse, J. Acoust. Soc. Am. 114, 1450 (2003).

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

2002 (1)

B. Chenni and J. Pouliquen, Rev. Quant. Nondestruct. Evaluat. 21, 1629 (2002).

2001 (1)

A. I. Lavrentyev and W. A. Veronesi, Proc. SPIE 4336, 88 (2001).

1997 (1)

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

1993 (1)

Z. Liu, Technical Acoustics (in Chinese) 12, 19 (1993).

1979 (1)

B. P. Fairand and A. H. Clauer, J. Appl. Phys. 50, 1497 (1979).

Cheng, M.

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Chenni, B.

B. Chenni and J. Pouliquen, Rev. Quant. Nondestruct. Evaluat. 21, 1629 (2002).

Clauer, A. H.

B. P. Fairand and A. H. Clauer, J. Appl. Phys. 50, 1497 (1979).

Dai, Y.

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Fairand, B. P.

B. P. Fairand and A. H. Clauer, J. Appl. Phys. 50, 1497 (1979).

Fan, Y.

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Guan, J.

Guo, D.

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Holland, S.

K. Y. Kim, W. Zou, S. Holland, and W. Sachse, J. Acoust. Soc. Am. 114, 1450 (2003).

Kim, K. Y.

K. Y. Kim, W. Zou, S. Holland, and W. Sachse, J. Acoust. Soc. Am. 114, 1450 (2003).

Lavrentyev, A. I.

A. I. Lavrentyev and W. A. Veronesi, Proc. SPIE 4336, 88 (2001).

Liu, Z.

Z. Liu, Technical Acoustics (in Chinese) 12, 19 (1993).

Lu, J.

Nagy, P. B.

A. Ruiz and P. B. Nagy, Ultrasonics 42, 665 (2004).

Ni, X.

Pouliquen, J.

B. Chenni and J. Pouliquen, Rev. Quant. Nondestruct. Evaluat. 21, 1629 (2002).

Ruiz, A.

A. Ruiz and P. B. Nagy, Ultrasonics 42, 665 (2004).

Sachse, W.

K. Y. Kim, W. Zou, S. Holland, and W. Sachse, J. Acoust. Soc. Am. 114, 1450 (2003).

Shen, Z.

Tang, Y.

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Veronesi, W. A.

A. I. Lavrentyev and W. A. Veronesi, Proc. SPIE 4336, 88 (2001).

Wang, J.

Wang, S.

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Wu, H.

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Xia, X.

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Xu, B.

Xu, X.

G. Yan, X. Xu, Z. Shen, J. Lu, and X. Ni, J. Optoelectronics Laser (in Chinese) 17, 107 (2006).

Yan, G.

G. Yan, X. Xu, Z. Shen, J. Lu, and X. Ni, J. Optoelectronics Laser (in Chinese) 17, 107 (2006).

G. Yan, Z. Shen, J. Lu, and X. Ni, Chin. Opt. Lett. 3, S329 (2005).

Yu, C.

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Zhang, H.

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Zhang, S.

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Zhang, Y.

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Zou, W.

K. Y. Kim, W. Zou, S. Holland, and W. Sachse, J. Acoust. Soc. Am. 114, 1450 (2003).

Appl. Laser (in Chinese) (1)

Y. Fan, S. Wang, H. Wu, D. Guo, Y. Dai, and X. Xia, Appl. Laser (in Chinese) 23, 6 (2003).

Chin. Opt. Lett. (2)

J. Acoust. Soc. Am. (1)

K. Y. Kim, W. Zou, S. Holland, and W. Sachse, J. Acoust. Soc. Am. 114, 1450 (2003).

J. Appl. Phys. (1)

B. P. Fairand and A. H. Clauer, J. Appl. Phys. 50, 1497 (1979).

J. Optoelectronics Laser (in Chinese) (1)

G. Yan, X. Xu, Z. Shen, J. Lu, and X. Ni, J. Optoelectronics Laser (in Chinese) 17, 107 (2006).

Proc. SPIE (1)

A. I. Lavrentyev and W. A. Veronesi, Proc. SPIE 4336, 88 (2001).

Rev. Quant. Nondestruct. Evaluat. (1)

B. Chenni and J. Pouliquen, Rev. Quant. Nondestruct. Evaluat. 21, 1629 (2002).

Sci. China Ser. E (in Chinese) (1)

Y. Zhang, S. Zhang, Y. Tang, H. Zhang, C. Yu, H. Wu, D. Guo, S. Wang, X. Xia, M. Cheng, and Y. Dai, Sci. China Ser. E (in Chinese) 27, 28 (1997).

Technical Acoustics (in Chinese) (1)

Z. Liu, Technical Acoustics (in Chinese) 12, 19 (1993).

Ultrasonics (1)

A. Ruiz and P. B. Nagy, Ultrasonics 42, 665 (2004).

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