Abstract

Lidar is an effective tool for remotely monitoring target or object, but the lidar signal is often affected by various noises or interferences. Therefore, detecting the weak signals buried in noises is a fundamental and important problem in the lidar systems. In this paper, an effective noise reduction method combining wavelet improved threshold with wavelet domain spatial filtration is presented to denoise pulse lidar signal and is investigated by detecting the simulating pulse lidar signals in noise. The simulation results show that this method can effectively identify the edge of signal and detect the weak lidar signal buried in noises.

© 2006 Chinese Optics Letters

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  1. S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).
  2. D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).
  3. D. L. Donoho, IEEE Trans. Information Theory 41, 613 (1995).
  4. D. L. Donoho and I. M. Johnstone, Biometrika 81, 425 (1994).
  5. Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).
  6. X. Yi and W. Wang, Opto-Electronic Engineering (in Chinese) 30, (6) 64 (2003).
  7. G. P. Nason and B. W. Silverman, The stationary wavelet transform and some statistical applications (Springer-Verlag, New York, 1995) p.281.
  8. S. Yin, W. Wang, and X. Li, Acta Opt. Sin. (in Chinese) 25, 1 (2005).

2005

S. Yin, W. Wang, and X. Li, Acta Opt. Sin. (in Chinese) 25, 1 (2005).

2003

X. Yi and W. Wang, Opto-Electronic Engineering (in Chinese) 30, (6) 64 (2003).

1995

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).

D. L. Donoho, IEEE Trans. Information Theory 41, 613 (1995).

1994

D. L. Donoho and I. M. Johnstone, Biometrika 81, 425 (1994).

Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).

1989

S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).

Donoho, D. L.

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).

D. L. Donoho, IEEE Trans. Information Theory 41, 613 (1995).

D. L. Donoho and I. M. Johnstone, Biometrika 81, 425 (1994).

Healy, D. M.

Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).

Johnstone, I. M.

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).

D. L. Donoho and I. M. Johnstone, Biometrika 81, 425 (1994).

Kerkyacharian, G.

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).

Li, X.

S. Yin, W. Wang, and X. Li, Acta Opt. Sin. (in Chinese) 25, 1 (2005).

Lu, J.

Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).

Mallat, S. G.

S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).

Picard, D.

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).

Wang, W.

S. Yin, W. Wang, and X. Li, Acta Opt. Sin. (in Chinese) 25, 1 (2005).

X. Yi and W. Wang, Opto-Electronic Engineering (in Chinese) 30, (6) 64 (2003).

Weaver, J. B.

Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).

Xu, Y.

Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).

Yi, X.

X. Yi and W. Wang, Opto-Electronic Engineering (in Chinese) 30, (6) 64 (2003).

Yin, S.

S. Yin, W. Wang, and X. Li, Acta Opt. Sin. (in Chinese) 25, 1 (2005).

Acta Opt. Sin. (in Chinese)

S. Yin, W. Wang, and X. Li, Acta Opt. Sin. (in Chinese) 25, 1 (2005).

Biometrika

D. L. Donoho and I. M. Johnstone, Biometrika 81, 425 (1994).

IEEE Trans. Image Processing

Y. Xu, J. B. Weaver, D. M. Healy, and J. Lu, IEEE Trans. Image Processing 3, 747 (1994).

IEEE Trans. Information Theory

D. L. Donoho, IEEE Trans. Information Theory 41, 613 (1995).

IEEE Trans. Pattern Analysis and Machine Intelligence

S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).

Journal of the Royal Statistical Society, Series B

D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard, Journal of the Royal Statistical Society, Series B 57, 301 (1995).

Opto-Electronic Engineering (in Chinese)

X. Yi and W. Wang, Opto-Electronic Engineering (in Chinese) 30, (6) 64 (2003).

Other

G. P. Nason and B. W. Silverman, The stationary wavelet transform and some statistical applications (Springer-Verlag, New York, 1995) p.281.

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