Superresolution Microscopy on the 25th Anniversary of STED Microscopy and the 20th Anniversary of SIM
Peter Kner, University of Georgia, USA (Lead Editor)
Suliana Manley, Swiss Federal Institute of Technology Lausanne, Switzerland
Yoav Shechtman, Technion Israel Institute of Technology, Israel
Sjoerd Stallinga, Delft University of Technology, The Netherlands
13 articles
Actions
- Export Citations as
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
- Save to my favorites
- Choose folder...