Comprehensive Interferometric Characterization of Red and Near-Infrared Emissions of C, H, N, O, F, Cl, Br, I, P, S, and Si in a 370-W Microwave-Induced Helium Plasma
D. E. Pivonka, A. J. J. Schleisman, W. G. Fateley, and R. C. Fry
Appl. Spectrosc. 40(6), 766-772 (1986) View:
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