Abstract

We report updated infrared (IR) absorption measurements on vapor-deposited cryogenic parahydrogen (pH₂) solids that indicate a ≈10% systematic error in our previous approach for determining a pH₂ solid's thickness (S. Tam, M.E. Fajardo. Appl. Spectrosc. 2001. 55(12): 1634-1644). We provide corrected values for the integrated absorption intensities of the Q₁(0)+S₀(0) and S₁(0)+S₀(0) bands calculated over the 4495–4520 cm⁻¹ and 4825–4855 cm⁻¹ regions, respectively. New polarized IR absorption spectroscopy data demonstrate the insensitivity to polarization effects of the peak intensity of the Q_R(0) phonon sideband near 4228 cm⁻¹. This feature provides an even quicker way for determining the thickness of a pH₂ solid than via the integrated absorptions.

© 2019 The Author(s)

Raman gain measurement in solid parahydrogen

M. Katsuragawa and K. Hakuta
Opt. Lett. 25(3) 177-179 (2000)

Refractive index measurements of solid parahydrogen

Manori Perera, Brian A. Tom, Yuki Miyamoto, Michael W. Porambo, Lauren E. Moore, William R. Evans, Takamasa Momose, and Benjamin J. McCall
Opt. Lett. 36(6) 840-842 (2011)

Effect of polarization on a solid immersion lens of arbitrary thickness

Kenneth M. Lim, Gary C. F. Lee, Colin J. R. Sheppard, Jacob C. H. Phang, Chee Leong Wong, and Xudong Chen
J. Opt. Soc. Am. A 28(5) 903-911 (2011)

Measurement method for the refractive index of thick solid and liquid layers

Branko Šantić, Davor Gracin, and Krunoslav Juraić
Appl. Opt. 48(22) 4430-4436 (2009)

Third-harmonic generation in disguise of second-harmonic generation revisited: role of thin-film thickness and carrier-envelope phase

C. Van Vlack and S. Hughes
Opt. Lett. 32(2) 187-189 (2007)