With the development of single-longitudinal mode diode lasers, there has been
an increase in using these sources for Raman spectroscopy. This is largely due to
the cost-effectiveness of diode lasers, which offer savings not only in initial
capital cost, but also electrical, cooling, and replacement costs over time, when
compared with ion lasers. The use of diode-lasers in confocal Raman microscopy has
remained a challenge, however, due to poor transverse beam quality. In this work, we
present the design and implementation of a simple spatial filter capable of adapting
a single-mode diode laser source to confocal Raman microscopy, yielding comparable
spatial resolution as a gas-ion laser beam for profiling and optical-trapping
applications. For profiling applications, spatial filtering improved x,y
resolution of the beam by a factor 10, which in turn increased optical-trapping
forces by ∼90 times and yielded sevenfold greater Raman scattering signal intensity
from an optically trapped phospholipid vesicle.
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription