Abstract
Spectral scans of atomic line emission sources with a Shimadzu UV2101PC
spectrophotometer show that the nominal wavelength depends upon the instrumental
slit width, the wavelength sampling interval, and for some slit widths, also on the
specified spectral range. The range dependence is manifested as a smoothing that
occurs when the range includes >65 sampled wavelengths, and it affects both the
wavelength and the line shape. For spectra not subject to this smoothing, the
wavelength error looks like a one-sample misassociation of the wavelength and
photometric readings. However, the instrument does reliably move to a specified
wavelength, independent of the scan parameter settings. These behaviors do not seem
to be documented anywhere but have been present in the software for operating this
instrument for about two decades.
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