Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 62,
  • Issue 2,
  • pp. 176-181
  • (2008)

Fourier Transform Infrared Analysis of Contamination by Searching Difference Spectra Against Libraries of Difference Spectra

Not Accessible

Your library or personal account may give you access

Abstract

A method is presented for quickly identifying contaminants in a material. Fourier transform infrared (FT-IR) spectra are collected for anomalous and normal material using a method that gives highly reproducible absolute intensity, such as attenuated total reflection (ATR) spectroscopy of liquids or solids that contact the crystal perfectly. The difference spectrum is calculated as the point-by-point subtraction of absorbance values without the use of a variable subtraction factor, giving a spectrum with positive and negative spectral features. This spectrum is then searched against libraries of difference spectra, such as spectra of possible contaminants minus the spectrum of normal material. The key advantage of the method is that it removes subjective judgment in choosing the subtraction factor. It also provides information about the material that is depleted along with identifying the contaminant.

PDF Article
More Like This
Analysis of far-infrared emission Fourier transform spectra

Jae H. Park and Bruno Carli
Appl. Opt. 25(19) 3490-3501 (1986)

Study on baseline correction methods for the Fourier transform infrared spectra with different signal-to-noise ratios

Xianchun Shen, Shubin Ye, Liang Xu, Rong Hu, Ling Jin, Hanyang Xu, Jianguo Liu, and Wenqing Liu
Appl. Opt. 57(20) 5794-5799 (2018)

Multiple order spectra in Fourier transform infrared spectroscopy

Tomas Hirschfeld
Appl. Opt. 16(7) 1905-1907 (1977)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved