The influence of the metal film thickness (i.e., the chromium adhesion promoting film and the gold film) on the sensitivity of surface plasmon resonance (SPR) signals (i.e., resonance angle shift and reflectance change) towards the thickness variation of the nonabsorbing dielectric film is investigated. The sensitivity of reflectance change decreases when a thick chromium film or a thin gold film is employed. Its linear range becomes narrower as the thickness of the metal films increases. The sensitivity and linear range of the resonance angle shift are not affected by the thickness variation of the metal films. The phenomena were theoretically explained based on the attenuated total reflection (ATR) generated evanescent field at the prism/metal interface and the SPR-generated evanescent field at the metal/dielectric interface.
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription