Abstract

This study shows the effects of roughness on infrared spectra shapes of thin corrosion products on metallic substrates. The calculated spectra show that the baseline is mainly affected by increasing roughness and that such effects do not shift the position of the absorption bands. The model obtained has been used to extract data of artificial patina on a copper surface. Surface defects of copper substrates can be distinguished on the whole surface, from the morphological and chemical points of view, using optical profilometry and infrared microspectroscopy. An homogeneous layer of cuprite covers the surface except in the linear defects. Fourier transform infrared (FT-IR) analysis indicates that a mixture of atacamite and clinoatacamite is mainly located in these scratchs. The width of these particular areas is in good agreement with profilometric observations.

Surface roughness measurements with an optical Fourier spectrum analyzer

B. J. Pernick
Appl. Opt. 18(6) 796-801 (1979)

Nondestructive volumetric optical analysis of corroded copper oxidation using 1700nm swept-source optical coherence microscopy

Young-Min Ko, Chang-Min Kang, Yong-Jae Lee, Hee-Jin Jang, Tae-Jung Ahn, and Tae Joong Eom
Opt. Express 31(22) 36281-36292 (2023)

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

Victor E. Asadchikov, Angela Duparré, Stefan Jakobs, Albert Yu. Karabekov, Igor V. Kozhevnikov, and Yury S. Krivonosov
Appl. Opt. 38(4) 684-691 (1999)

Optical effects of energetic copper-ion irradiation on copper mirrors

John S. Hartman
Appl. Opt. 20(23) 4062-4072 (1981)

Optical scattering from oxidized metals. 2: Model verification for oxidized copper

Mikael Bergkvist, Arne Roos, Carl G. Ribbing, Jean M. Bennett, and Lars Mattsson
Appl. Opt. 28(18) 3902-3907 (1989)