Use of Synchrotron Reflectance Infrared Spectromicroscopy as a Rapid, Direct, Nondestructive Method for the Study of Inks on Paper

T. J. Wilkinson; D. L. Perry; M. C. Martin; W. R. McKinney; A. A. Cantu

Applied Spectroscopy
Vol. 56,
Issue 6,
pp. 800-803
(2002)

Use of Synchrotron Reflectance Infrared Spectromicroscopy as a Rapid, Direct, Nondestructive Method for the Study of Inks on Paper

T. J. Wilkinson, D. L. Perry, M. C. Martin, W. R. McKinney, and A. A. Cantu

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T. J. Wilkinson, D. L. Perry, M. C. Martin, W. R. McKinney, and A. A. Cantu, "Use of Synchrotron Reflectance Infrared Spectromicroscopy as a Rapid, Direct, Nondestructive Method for the Study of Inks on Paper," Appl. Spectrosc. 56, 800-803 (2002)

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Applied Spectroscopy