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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 55,
  • Issue 12,
  • pp. 1676-1681
  • (2001)

Use of Near Edge X-ray Absorption Fine Structure Spectromicroscopy to Characterize Multicomponent Polymeric Systems

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Abstract

The merits of a polymer characterization technique, near edge X-ray absorption fine structure (NEXAFS) spectromicroscopy, are demonstrated through the characterization of a multilayer polymer film with partially unknown chemical composition. The combination of chemical speciation through NEXAFS spectroscopy with the high spatial resolution available in X-ray microscopy allows the characterization of polymeric materials not possible with conventional techniques. Analysis of a multilayer with layers as thin as 4 μm has yielded results that differ from those previously obtained by infrared microscopy. Layers below the spatial resolution limit of infrared microscopy were characterized.

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