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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 54,
  • Issue 10,
  • pp. 1423-1428
  • (2000)

Spatial Mapping of Electroluminescence Due to Impact Ionization in High Electron Mobility Transistors

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Abstract

For the first time to our knowledge, the use of a Raman microspectrometer is proposed for recording electroluminescence spectra as well as generating complete electroluminescence maps of areas selected on the surface of a pseudomorphic high electron mobility transistor (PHEMT). More particularly, this microspectrometer was used to investigate the impact ionization effect in different regions of the PHEMT located between gate and drain.

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