Abstract

A procedure has been developed to permit recalculation of a Raman spectrum that has been taken on a source spectrometer to allow its quantitative use with data taken from a target system. The procedure is based on accurate characterization of both the source and target spectral abscissas by means of a neon spectrum that is recorded at the time the Raman measurements are made. Corrections are made for wavelength-dependent behavior of both systems, for differences in dispersion for the two systems, and for variation in the number, spacing, and size of the detector elements. An example is presented in which the fingerprint and CH regions of the Raman spectrum of cyclohexane are transferred from higher to lower resolution context.

An Instrument for Measurement of the Optical Transfer Function

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D. H. Rank and J. A. Van Horn
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Instrument transfer function of slope measuring deflectometry systems

Tianquan Su, Alejandro Maldonado, Peng Su, and James H. Burge
Appl. Opt. 54(10) 2981-2990 (2015)

Validity of the instrument transfer function for fringe projection metrology

Bin Zhang, Angela Davies, Christopher Evans, and John Ziegert
Appl. Opt. 57(11) 2795-2803 (2018)