Abstract

The fractal characteristics of roughened silver electrode surfaces are used for a light microscopy diagnostic for the surface-enhanced Raman activity of the surfaces. It is shown that the fractal dimension of an electrode as measured from scanning electron microscope images (resolution 0.08 mu m) is the same as measured from extended focus (EF) light microscopy images (resolution < 0.4 mu m). There is a threshold fractal dimension for SERS activity. The threshold is independent of the adsorbed molecule.

Characterization of a commercialized SERS-active substrate and its application to the identification of intact Bacillus endospores

Troy A. Alexander and Dianna M. Le
Appl. Opt. 46(18) 3878-3890 (2007)

Surface-enhanced Raman imaging of fractal shaped periodic metal nanostructures

Jonas Beermann, Sergey M. Novikov, Ole Albrektsen, Michael G. Nielsen, and Sergey I. Bozhevolnyi
J. Opt. Soc. Am. B 26(12) 2370-2376 (2009)

SERS-active substrate based on gap surface plasmon polaritons

Hyun Chul Kim and Xing Cheng
Opt. Express 17(20) 17234-17241 (2009)

Surface enhanced Raman scattering (SERS) by molecules adsorbed at spherical particles: errata

Milton Kerker, Dau-Sing Wang, and H. Chew
Appl. Opt. 19(24) 4159-4174 (1980)

Surface enhanced Raman scattering (SERS) by molecules adsorbed at spherical particles

M. Kerker, D.-S. Wang, and H. Chew
Appl. Opt. 19(19) 3373-3388 (1980)