Abstract

Dynamic FT-IR spectra in the amide I region were measured for silk fibroin cast films. Phase analyses of the dynamic spectra were carried out in order to separate them into several components which are due to the secondary structures of fibroin. These observations showed that peak positions of the amide I bands were in good agreement with those obtained by Fourier self-deconvolution procedures. In conclusion, phase analysis of dynamic FT-IR spectra is a powerful technique for separation of highly overlapping bands.

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