Abstract

A synchrotron X-ray fluorescence microprobe has been used to study the composition and microstructure of pulsed-laser ablationdeposited films of calcium-nickel-potassium oxides that have applications in heterogeneous catalysis. The films, whose individual metal oxide components have widely varying boiling points and thus prevent a solid-phase synthesis with the use of standard thermal techniques, represent a new quaternary metal oxide phase containing the three elements. Experimental conditions for preparing the films are given. The X-ray fluorescence microprobe data are discussed with respect to both the distribution of the three metals in the films at the micrometer lateral spatial resolution level and the presence of trace amounts of metals that were introduced into the films as contaminants in targets made of the parent three-metal oxide.

Characterization of vanadium oxide optical thin films by x-ray diffractometry

Elizabeth E. Chain
Appl. Opt. 28(4) 713-716 (1989)

Synchrotron-based x ray fluorescence ghost imaging

Mathieu Manni, Adi Ben-Yehuda, Yishai Klein, Bratislav Lukic, Andrew Kingston, Alexander Rack, Sharon Shwartz, and Nicola Viganò
Opt. Lett. 48(23) 6271-6274 (2023)

Synchrotron X-ray metrology of dopant distribution and oxidation state in high pressure CVD grown TM²⁺:ZnSe optical fibers

Michael G. Coco, Stephen C. Aro, Alexander Hendrickson, James P. Krug, Barry Lai, Zhonghou Cai, Pier J. Sazio, Sean A. McDaniel, Gary Cook, Venkatraman Gopalan, and John V. Badding
Opt. Mater. Express 11(2) 289-298 (2021)

Reflection of X-Rays from Condensed Metal Films*†

L. M. Rieser
J. Opt. Soc. Am. 47(11) 987-994 (1957)

X-ray metal film filters at cryogenic temperatures

Ritva A. M. Keski-Kuha
Appl. Opt. 28(14) 2965-2968 (1989)