Abstract

A diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) chamber suitable for <i>in situ</i> and simultaneous analysis of the infrared and electrical response of sensors is tested and described in detail. Experiments on a CdGeON sensor show some results about its reversible/irreversible behavior in terms of temperature and under N₂ atmosphere. A direct relationship between the conductivity and the elimination of DRIFTS peaks at 810, 780, and 580 cm^-1 is observed. From both DRIFTS spectra and conductivity measurements, an explanation involving the presence and filling of vacancies in the solid framework is proposed.

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