Abstract
The optical behavior of a thin film (<i>i.e.,</i> peak positions and intensities of infrared spectra) has been discussed for reflection under a thin-film approximation. The reflection spectra of anisotropic and isotropic thin films on various substrates (transparent, dielectric and absorbing, and semi-metal) have been simulated at various angles of incidence in the infrared region for external and internal reflection. For spectral simulation, the matrix method has been used in conjunction with noise-free complex refractive indices based on dispersion theory. The peak positions in the simulated spectra have been compared with transverse optic and longitudinal optic frequencies based on macroscopic theory. The simulated peak intensities for the films have been compared with the prediction based on the thin-film approximation. The optical behavior of reflection spectra has also been examined in detail for a thin film on water or highly oriented pyrolytic graphite.
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription