Abstract

This paper describes a fast background correction system based on wavelength modulation that can be adapted to any dispersive ICP spectrometer. It consists of a quartz refractor plate which oscillates just behind the entrance slit to perform rapid wavelength scanning across the emission line. The system inertia is small and allows a fast scan rate, which permits real-time background measurement during fast transient signals. It has been successfully applied to flow-injection-ICP-atomic emission analysis (FIA-ICP-AES). A simple and inexpensive interface is presented to perform wavelength modulation control and data acquisition by an IBM-XT microcomputer. Different mathematical approaches are compared to handle the spectral line intensity, as well as the FIA-AES peaks. The result is a simplified and fast data treatment which can be easily handled by any small microcomputer.

Optimized laser-induced breakdown spectroscopy for determination of xenobiotic silver in monosodium glutamate and its verification using ICP-AES

I. Rehan, M. A. Gondal, and K. Rehan
Appl. Opt. 57(12) 3191-3197 (2018)

Theoretical description based on Fourier analysis of wavelength-modulation spectrometry in terms of analytical and background signals

Pawel Kluczynski and Ove Axner
Appl. Opt. 38(27) 5803-5815 (1999)

Characterization of background signals in wavelength-modulation spectrometry in terms of a Fourier based theoretical formalism

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 770-782 (2001)

Background signals in wavelength-modulation spectrometry by use of frequency-doubled diode-laser light. II. Experiment

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 794-805 (2001)

Background signals in wavelength-modulation spectrometry with frequency-doubled diode-laser light. I. Theory

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 783-793 (2001)