Abstract

A unique spectrometer system, the Multi-Mode Spectrometer (MMS), has been developed. The MMS integrates a scanning Michelson interferometer, a flat-field grating, and a linear photodiode array detector into a single spectrometer system. With these components, the MMS is capable of applying dispersive, interferometric, or combined dispersive/interferometric techniques for enhanced spectrometric flexibility. The effects of source fluctuation and redistributed photon noise can be reduced. In addition, the MMS has unique capabilities in data compression, application of internal standards, and noise spectrum analysis.

Multichannel grazing-incidence spectrometer for plasma impurity diagnosis: SPRED

R. J. Fonck, A. T. Ramsey, and R. V. Yelle
Appl. Opt. 21(12) 2115-2123 (1982)

Spectrometer based on a compact disordered multi-mode interferometer

Ankit Poudel, Pravin Bhattarai, Rijan Maharjan, Maddison Coke, Richard J Curry, Iain F Crowe, and Ashim Dhakal
Opt. Express 31(8) 12624-12633 (2023)

A Multichannel Spectrometer for Simultaneous Atomic Absorption and Flame Emission Analysis

R. Mavrodineanu and R. C. Hughes
Appl. Opt. 7(7) 1281-1285 (1968)

Fourier transform spectrometer with a self-scanning photodiode array

Takayuki Okamoto, Satoshi Kawata, and Shigeo Minami
Appl. Opt. 23(2) 269-273 (1984)

Extreme ultraviolet imaging spectrometer for thermospheric emissions

Marsha R. Torr and R. C. Vitz
Appl. Opt. 21(17) 3080-3090 (1982)