Abstract

Infrared external reflection spectroscopy (IR-ERS) has become an important tool for probing the molecular architecture of chemically modified surfaces. Combined with considerations based on classical electromagnetic theory, this technique has been used to characterize monomolecular and thin polymeric films at surfaces with a variety of reflectivities. Research efforts in the areas of adhesion, electrocatalysis, corrosion inhibition, and microelectronics have all benefitted from the information obtained by IR-ERS.

Sample holder and methodology for measuring the reflectance and transmittance of narrow-leaf samples

Scott D. Noble and Trever G. Crowe
Appl. Opt. 46(22) 4968-4976 (2007)

New Sample Holder for Reflection Measurements with the Beckman Model DU Spectrophotometer

G. Tonnquist
J. Opt. Soc. Am. 45(7) 582-582 (1955)

Improved sample characterization in terahertz reflection imaging and spectroscopy

Shengyang Huang, Philip C. Ashworth, Kanis W. C. Kan, Yang Chen, Vincent P. Wallace, Yuan-ting Zhang, and Emma Pickwell-MacPherson
Opt. Express 17(5) 3848-3854 (2009)

Application of thin-film interference coatings in infrared reflection spectroscopy of organic samples in contact with thin metal films

Martina Reithmeier and Andreas Erbe
Appl. Opt. 50(9) C301-C308 (2011)

Thickness determination of graphene on metal substrate by reflection spectroscopy

Tommi Kaplas, Aleksey Zolotukhin, and Yuri Svirko
Opt. Express 19(18) 17226-17231 (2011)