Abstract

In the past, the usefulness of laser Raman spectroscopy as an analytical technique in industrial laboratories has been greatly reduced by problems of laser-induced fluorescence. One method of circumventing this problem is to use near-infrared excitation coupled with a modified FT-IR spectrometer. In this paper, we report the results of some initial exploratory experiments which indicate that significant fluorescence rejection can be achieved. This fluorescence rejection opens up new areas of application for Raman spectroscopy. The advantages and limitations of FT-Raman spectroscopy are discussed. In addition, some initial experiments are outlined on Fourier transform Raman microscopy using a conventional microscope.

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