Abstract

The effect of a single defective mask element on the output signal-to-noise ratio (SNR) for a stationary-mask Hadamard transform (HT) spectrometer is investigated. The decrease in output-SNR from that of an HT spectrometer having a perfect mask is found to be dependent on the amount of energy impinging on the defective element. A method of compensating for the defective mask element is presented. The method is computationally inexpensive and can be fully automated.

Multiplex advantage in Hadamard transform spectrometry utilizing solid-state encoding masks with uniform, bistable optical transmission defects

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