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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 42,
  • Issue 4,
  • pp. 681-684
  • (1988)

Comparison Between a TIAP Crystal and a PX1 Multilayer Pseudocrystal in Light Element X-Ray Fluorescence Emission Using Different Excitation Sources

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Abstract

A PX1 multilayer pseudocrystal is compared with a TIAP crystal for the analysis of light elements by means of two different excitation sources, i.e., a chromium and a scandium target tube. Peak and background intensities for Cl, S, P, Si, Al, Mg, Na, F, and O are compared with the use of both a fine and a coarse collimator. The most suitable working conditions for the analysis are pointed out.

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