A novel design of an accessory for diffuse reflectance spectroscopy in the infrared region is presented which allows <i>in situ</i> analysis of small surface areas (&phis; 3 mm) on bulky samples. The optical design and performance with particular respect to the rejection of specularly reflected radiation are discussed, and results for different varnishes are shown.

PDF Article

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.