Diffuse reflectance infrared Fourier transform spectrometry was applied to the determination of SiO<sub>2</sub> in SiC powders. The main peaks of SiO<sub>2</sub> were observed in the 1000-1250 cm<sup>−1</sup> region. The peak intensities were estimated from the peak height at 1150 cm<sup>−1</sup>. The intensities were little affected by the particle sizes of SiC powders in the 1-9-μm region. The linear relationship between peak intensity and concentration was obtained in the concentration range of 0-5 wt% SiO<sub>2</sub>. The analytical curve was successfully used for the determination of SiO<sub>2</sub> in a few commercial SiC powders.

PDF Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription