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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 38,
  • Issue 5,
  • pp. 678-680
  • (1984)

Fourier Transform Spectrometry in the Far-Infrared to High-Microwave Spectral Region Using a Rapid-Scan Interferometer

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Abstract

An experimental set-up, based on a commercial rapid-scan Fourier transform spectrometer, for dielectric loss measurements on low-loss materials in the frequency region between 120 GHz and 1650 GHz (455 cm<sup>−1</sup>) is described. Results obtained for cyclohexane are presented as an example of application.

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