Abstract

We report FT-IR-VCD recorded under improved conditions of signal-to-noise ratio, resolution, and spectral range (to 800 cm⁻¹). Detailed descriptions are provided in the areas of artifact suppression, phase correction procedures, and comparison of FT-IR to dispersive VCD measurements. Spectral evidence supports the proposition that VCD absorbance artifacts are a surface effect originating at the optical window–solution interface.

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