Abstract

Factor analysis has been used to resolve the overlapping XPS spectra obtained in the x-ray-induced transformation of Pt(en)₂(OH)₂Cl₂ to Pt(en)₂Cl₂. This is achieved without prior knowledge of the data set nor the establishment of any initial curve fitting criteria.

Depth-resolved XPS analysis of classically manufactured glass surfaces: suggesting the impact of polishing-induced modifications on the performance of optical systems

Christoph Gerhard and Robert Köhler
Opt. Mater. Express 12(9) 3658-3666 (2022)

XPS analysis of metallic trace contaminations on fused silica surfaces induced by classical optics manufacturing

Robert Köhler and Christoph Gerhard
Opt. Mater. Express 11(11) 3844-3853 (2021)

Application of non-negative matrix factorization to multispectral FLIM data analysis

Paritosh Pande, Brian E. Applegate, and Javier A. Jo
Biomed. Opt. Express 3(9) 2244-2262 (2012)

Mathematical Resolution of Overlapping Spectral Lines

Henry Stone
J. Opt. Soc. Am. 52(9) 998-1003 (1962)

Calculation of the overlap factor for scanning LiDAR based on the tridimensional ray-tracing method

Ruiqiang Chen, Yuesong Jiang, Luhong Wen, and Donghai Wen
Appl. Opt. 56(16) 4636-4645 (2017)