Abstract

The effect of spectrometer resolution on the peak intensity and the full width at half maximum (FWHM) of a Lorentzian spectrum is obtained by evaluating the convoluted line shapes. Spectrometer resolution functions (SRF) having Gaussian and triangular profiles are considered separately. Empirical relations to estimate the true peak intensity and the FWHM from the observed parameters are suggested. These relations are valid over an extended range of parameters with an accuracy better than that of other methods suggested earlier. As an application, the true FWHM's and peak intensities of the main component of the Raman active <i>A_g</i> mode of sulphate ion in potash alum at low temperatures are evaluated.

Distortion of Spectral Line Shapes by Recording Instruments*

K. Frei and Hs. H. Günthard
J. Opt. Soc. Am. 51(1) 83-86 (1961)

Correction of Instrument Line-Shape Distortions in Fourier Transform Spectroscopy

Piera Raspollini, Peter Ade, Bruno Carli, and Marco Ridolfi
Appl. Opt. 37(17) 3697-3704 (1998)

Detection and correction of instrumental line-shape distortions in Fourier spectroscopy

Mikko Ahro, Jyrki Kauppinen, and Ilkka Salomaa
Appl. Opt. 39(33) 6230-6237 (2000)

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E. J. Rosenbaum, C. C. Cerato, and J. L. Lauer
J. Opt. Soc. Am. 42(9) 670-672 (1952)

Direct extraction of Raman line-shapes from congested CARS spectra

Erik M. Vartiainen, Hilde A. Rinia, Michiel Müller, and Mischa Bonn
Opt. Express 14(8) 3622-3630 (2006)