Abstract

The theoretical dependence of band contour on effective slit width is examined with the object of obtaining a simple method of representation. With an initial Lorentzian the contour can be expressed to a good approximation as a sum of Lorentzian and Gaussian components, and the variation of the function with slit width is studied. How the results can be applied to resolution enhancement is also shown. Two other functions are compared to the sum. The contour arising from distribution of pure forms about a center is briefly investigated.

Uses of Retardation Plates in SpectrophotometryI. Determination of Slit Shape and Slit Width

George L. Buc and E. I. Stearns
J. Opt. Soc. Am. 35(7) 458-464 (1945)

Slit-Width Effects in Spectrophotometry

W. H. Eberhardt
J. Opt. Soc. Am. 40(3) 172-176 (1950)

The Correction of Slit-Width Errors

Arthur C. Hardy and F. Mansfield Young
J. Opt. Soc. Am. 39(4) 265-270 (1949)

Slit-Width Effects

Svend Brodersen
J. Opt. Soc. Am. 44(1) 22-25 (1954)

Determination of Line-Widths by Slit-Width Alterations

Murphy L. Dalton
Appl. Opt. 4(5) 603-607 (1965)