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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 34,
  • Issue 1,
  • pp. 95-97
  • (1980)

Improved Sensitivity in Dual-Beam Fourier Transform Infrared Spectroscopy

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Abstract

The measurement of optically subtracted interferograms in Fourier transform infrared (FT-IR) spectroscopy allows the use of the more sensitive mercury cadmium telluride (MCT) detector with intense sources without exceeding the dynamic range of a 15-bit analog-to-digital converter. The method was first suggested by Coleman and was first experimentally demonstrated by Bar-Lev. Since that time there have been a number of attempts to incorporate the dual-beam principle into far infrared and mid infrared FT-IR spectrometers, and even into a special purpose commercial GC-IR instrument.

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