Abstract
When the infrared spectrum of a sample is to be recorded, it is not always convenient to locate the sample and its supportive apparatus within the sample chamber of a spectrometer. The beam-projecting device described herein permits redirection of the infrared beam from the sample chamber to a location outside the spectrometer. Thus the effort required to obtain infrared spectra of <i>in situ</i> samples using a Fourier transform spectrometer is greatly reduced. The unique capability of this infrared beam projector is its ability to accommodate the large diameter beam of a Fourier transform spectrometer, even in the far infrared mode, without appreciable loss of throughput.
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription