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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 29,
  • Issue 4,
  • pp. 322-326
  • (1975)

Integral Reflection Coefficient of X-ray Spectrometer Crystals

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Abstract

Analyzing crystals used in x-ray spectrometers have widely varying diffraction efficiencies. When employed in x-ray fluorescence analysis, the parameter which defines the efficiency is the integral reflection coefficient. This parameter has been measured using a single crystal spectrometer, as a function of wavelength, for a number of crystals commonly used. A recent adaptation of an existing diffraction theory is shown to make possible the calculation of integral reflection coefficients which agree with measured values.

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