Abstract

An emission spectrographic method of analysis is described in which trace quantities of hafnium are determined in zirconium dioxide. The sample preparation, starting with zirconium metal sheet or zirconium dioxide, is discussed in detail. The excitation source used is an ac spark. Quantitation was achieved with a dual grating emission spectrograph. The analytical range of the method for the analysis of hafnium is 5 to 1000 ppm with a relative standard deviation of 9.7%.

Quantitative Spectrographic Analysis of Zirconium-Hafnium Mixtures*

Velmer A. Fassel and Charles H. Anderson
J. Opt. Soc. Am. 40(11) 742-747 (1950)

X-Ray Spectroscopy as a Control Method in the Production of Zirconium and Hafnium

D. M. Mortimore and P. A. Romans
J. Opt. Soc. Am. 42(9) 673-677 (1952)

Determination of the Spectral Emission of Commercial Flashbulbs by Emission Spectrographic Techniques

D. J. Bracco and S. Weisberger
Appl. Opt. 5(8) 1275-1279 (1966)

The Quantitative Spectrographic Analysis of the Rare Earth Elements*I. Determination of Samarium in NeodymiumII. Determination of Europium in Samarium

Velmer A. Fassel and Harley A. Wilhelm
J. Opt. Soc. Am. 38(6) 518-526 (1948)

Use of hafnium dioxide in multilayer dielectric reflectors for the near uv

P. Baumeister and O. Arnon
Appl. Opt. 16(2) 439-444 (1977)