Abstract

Resolution enhancement of line emission spectra by deconvolution is described. This is carried out by solving the convolution integral which relates the real spectrum and the slit function to the observed spectrum. This integral is solved in the Fourier domain where deconvolution reduces to division. In certain measurement situations limitations and problems exist with respect to the degree of resolution enhancement that is possible and with respect to the line shape that is achieved in the deconvolved spectrum. These situations are discussed and illustrated. With this approach to resolution enhancement the line width at half-height can be reduced by about 25% for emission spectra that have been measured with a spectral slit width that is wider than the spectral line width.

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