Abstract

The effects of extraneous materials in the point-to-plane Uni-Arc excitation of copper-base alloys were investigated. A number of materials were shown to increase markedly the line-to-background ratio. It was demonstrated that copper-containing materials could be used to obtain a constant intensity for the copper internal standard line despite wide variations in copper content from sample to sample, eliminating the need for concentration ratio methods in which the copper concentration must be known or determined. Data are presented which indicate that the technique is applicable to the point-to-plane analysis of a variety of copper-base alloys for trace constituents with a reasonable degree of precision and accuracy.

The Influence of Extraneous Elements on Line Intensity. IV. Extraneous Element Effects in the Direct-Current Arc*

Wallace R. Brode and Donald L. Timma
J. Opt. Soc. Am. 39(6) 478-481 (1949)

The Influence of Extraneous Elements on Line IntensityIII. The Effect of Anions*

Wallace R. Brode and Edwin S. Hodge
J. Opt. Soc. Am. 31(1) 58-63 (1941)

The Effect of Extraneous Radiation on Photometric Accuracy of Infrared Spectrophotometers

James E. Stewart
Appl. Opt. 2(11) 1141-1146 (1963)

The Spectrochemical Analysis of Copper Base Alloys*

Edwin K. Jaycox
J. Opt. Soc. Am. 35(2) 175-179 (1945)

Time Effects and Arc Intensities*

Henry Hemmendinger
J. Opt. Soc. Am. 32(3) 149-153 (1942)